PN Junction Diode: I-V Characteristics
Sung June Kim
http://helios.snu.ac.kr
Chapter 6.
Contents
q Qualitative Derivation
q Quantitative Solution Strategy
q Quasineutral Region Considerations q Depletion Region Considerations
q Boundary Conditions
2
q The Ideal Diode Equation
• Qualitative Derivation
ü Equilibrium situation
ü The I-V characteristics of the ideal diode are modeled by the ideal diode equation à qualitative and quantitative derivation
potential hill
high-energy carrier diffusion
drift
balance
E
ü Forward bias situation
à a lowering of the potential hill ü The same number of minority
carriers are being swept
ü More majority carriers can surmount the hill à IN and IP à I
ü The number of carriers that have sufficient energy to
surmount the barrier goes up exponentially with VA à
exponential increase of the forward current
ü The barrier increase
reduces the majority carrier diffusion to a negligible level ü The p-side electrons and n-side holes can wander into the depletion region and be swept to the other side à reverse I (nàp)
ü Reverse bias situation
à an increase of the potential hill
ü Being associated with
minority carriers, the reverse bias current is expected to be extremely small
ü The minority carrier drift currents are not affected by the height of the hill (The situation is similar to a waterfall)
ü If the reverse bias saturation current is taken to be –I0, the overall I-V dependence is
I-V characteristic
A/ ref
0
(
V V1)
I = I e -
Rectification
q
V
ref= kT
ü Whenever an electron on the p-side moves to the n-side, it is replaced by an electron generated through one of the R-G centers
ohmic ohmic
minority
minority
excess majority carriers à local
excess majority carriers à local
E
E
Excess carriers move to the contact with a relaxation time à greatly fast
recombination
ü Current component
Depletion region : electrons and holes p-region (far) : holes
n-region (far) : electrons
• Quantitative Solution Strategy ü Basic assumptions
(1) Steady state conditions
(2) A nondegenerately doped step junction (3) One-dimensional
(4) Low-level injection (5) GL=0
N
( )
P( )
J = J x + J x
N n N
P p P
J qu n qD dn
dx J qu p qD dp
dx
= +
= +
E E
AJ
I =
• Quasineutral Region Considerations
2
p p p
N 2 L
n 2
n n n
P 2 L
p
n n n
D G
t x
p p p
D G
t x
t t
¶D ¶ D D
= - +
¶ ¶
¶D ¶ D D
= - +
¶ ¶
2
p p
N 2 p
n 2
n n
P 2 n
p
0 . . .
0 . . .
d n n
D x x
dx
d p p
D x x
dx
t t
D D
= - £ -
D D
= - ³
and low-level injection à minority carrier diffusion equations
0
E @
ü Since and dn
E @ 0
0/dx=dp0/dx=0 in the quasineutral regionsp
N N p
n
P P n
. . . . . .
J qD d n x x
dx
J qD d p x x
dx
= D £ -
= - D ³
0 p
0 n
n n n
p p p
= + D
= + D
Q
ü We can only determine JN(x) in the quasineutral p-region and JP(x) in the quasineutral n-region
• Depletion Region Considerations
N P
thermal thermal
R G R G
1 1
0 dJ n , 0 dJ p
q dx t q dx t
- -
¶ ¶
= + = - +
¶ ¶
processes other
G R thermal P
processes other
G R thermal N
t p t
J p q
t p
t n t
J n q
t n
¶ + ¶
¶ + ¶
× Ñ -
¶ =
¶
¶ + ¶
¶ + ¶
× Ñ
¶ =
¶
- -
1
1
ü Suppose that thermal recombination-generation is negligible throughout the depletion region;
ü à JN and JP are constants inside the
depletion region
thermal R-G thermal R-G
/ | / | 0
n t p t
¶ ¶ = ¶ ¶ =
/ 0 and / 0
N P
dJ dx = dJ dx =
N p n N p
P p n P n
( ) ( )
( ) ( )
J x x x J x
J x x x J x
- £ £ = -
- £ £ =
N
(
p)
P(
n)
J = J - x + J x
• Boundary Conditions
ü At the Ohmic Contacts
The ideal diode is usually taken to be a “wide-base” diode
The contacts may effectively be viewed as being positioned at x=
±¥
ü At the Depletion Region Edges
Under nonequilibrium conditions:
Equilibrium conditions Nonequilibrium conditions
( )
( ) 0
0
= +¥
® D
= -¥
® D
x p
x n
n p
( )
(
E F)
kTi kT
E F i
p i i
N
p n e
e n
n =
- /, =
- /L
n� � L
pN P
( ) /
2 F F kT
np = n e
i -A / 2
p n
. . .
qV kT
np = n e
i- x £ x £ x
A
Fp F
P N
qV
E E
F
F
N=
-
£ -
If the equal signal is assumed to hold throughout the depletion region
: law of junction
ü Evaluating the equation at the p-edge
A/ 2
p p p A i
( ) ( ) ( )
qV kTn - x p - x = n - x N = n e
A
2 i / p
A
( ) n
qV kTn x e
- = N
A
2 i /
p p
A
( ) n (
qV kT1)
n x e
D - = N -
ü Similarly,
A
2 i /
n n
D
( ) n (
qV kT1)
p x e
D = N -
• Derivation Proper
ü The origin of coordinates is shifted to the n-edge of the depletion region
2
n n '
P '2
p
0 d p p . . . 0
D x
dx t
D D
= - ³
'
n
( ) 0
p x
D ® ¥ =
A
2
' i /
n
D
( 0) n (
qV kT1)
p x e
D = = N -
ü Boundary conditions
ü The general solution
P P
'/ '/
'
n 1 2
'
( )
. . . 0
x L x L
p x A e A e x
D =
-+
³ Q L
P= D
P pt
ü A2 à 0 because exp(x’/Lp) à ¥ as x’ à ¥ ü With , A1=Dpn(x’=0)
A P
2
/ '/
' i '
n
D
( ) n (
qV kT1)
x L. . . 0
p x e e x
N
D = -
-³
A P
2
/ '/
' n P i '
P P '
P D
( ) d p D n (
qV kT1)
x L. . . 0
J x qD q e e x
dx L N
D
-= - = - ³
ü On the p-side of the junction with the x’’-coordinate.
N A
2
"/
" i / "
p
A
( ) n (
qV kT1)
x L. . . 0
n x e e x
N
D = -
-³
N A
2
p / "/
" N i "
N N "
N A
( ) d n D n (
qV kT1)
x L. . . 0
J x qD q e e x
dx L N
D
-= - = - ³
ü The current densities at the depletion region edges,
A
2
" N i /
N p N
N A
( ) ( 0) D n (
qV kT1)
J x x J x q e
L N
= - = = = -
A
2
/
' P i
P n P
P D
( ) ( 0) D n (
qV kT1)
J x x J x q e
= = = = L N -
A
2 2
N i P i /
N A P D
(
qV kT1)
D n D n
I AJ qA e
L N L N
æ ö
= = ç + ÷ -
è ø
A/ 0
2 2
N i P i
0
N A P D
(
qV kT1) I I e
D n D n I qA
L N L N
= -
æ ö
º ç + ÷
è ø
Ideal diode equation or Shockley equation
• Examination of Results
ü Carrier currents
ü The total current density is constant
ü The majority-carrier current densities are obtained by graphically subtracting the minority-carrier current densities from the total current density
ü Carrier concentrations
ü Forward biasing increases the concentration Reverse decreases
ü Under the low-level injection, the majority carrier
concentrations in these regions are everywhere approximately equal to their equilibrium values
ü Under reverse biasing the depletion
region acts like a “sink” for minority carriers ü Larger reverse biases have little effect
NA > ND
6.2.2 Reverse-Bias Breakdown
q Zener Process
• Tunneling
– The particle energy remains constant during the process.
ü The particle and the barrier are not damaged.
(1) There must be filled states on one side and empty states on the other side at the same energy.
(2) d must be very thin.
Reverse bias↑ ⇒ # of filled valence electrons placed opposite empty conduction-band states↑ ⇒ current↑
6.2.3 The R-G Current
ü A current far in excess of that predicted by the ideal theory exists at small forward bias and all reverse biases.
← thermal recombination-generation in the depletion region
Ec
Ef Ev
Ec Ef
Ev
VR IR
VR = 0 V (Equilibrium)
Ec
Ef Ev
Ec Ef
Ev
VR IR
h+
VR < 0 V VR = 0 V e-
VR IR
Ec
Ef Ev
Ec Ef
Ev e-
e- e-
e- e-
VR << 0 V (Zener Breakdown, Tunneling)VR = 0 V
ü Reverse bias ⇒ , ⇒ thermal generation ü Forward bias ⇒ , ⇒ recombination
(1) The net R-G rate is the same for electrons and holes.
(2) For every electron-hole pair created or destroyed per second, one electron per second flows into or out of the diode contacts.
n
0n < p < p
0n
0n > p > p
0G R DIFF
kT E E n kT
E E p i
n i
p i G
R
x
x p n
i G
R
n p
i G
R thermal
G R thermal x
G x R
I I
I
e n e
p n
n qAn W I
p n
p dx p
n n
n qA np
I
p p
n n
n np t
n
t dx qA n
I
T i i
T n
p n
p
-
- -
- - -
-
- - -
+
=
+
= +
º
-
=
®
®
+ +
+
= -
+ +
+ - -
¶ =
¶
¶ - ¶
=
ò ò
) 2 (
) 1 2 (
1
2 0 ,
0
) (
) (
) (
) (
/ ) (
/ ) 1 (
1 0
0
1 1
2
1 1
2
t t
t t
t
t
t t
t
t
E E kTi
kT E E i
T i
i T
e n p
e n n
/ ) (
1
/ ) (
1
- -
º
º
Summary
31
Summary
32