Dispersion and Field Control in a Metasurface-Implanted Waveguide

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Dispersion and Field Control in a Metasurface-Implanted Waveguide

Item Type Conference Paper

Authors Chen, Pai-Yen;Erricolo, Danilo;Shamim, Atif;Bagci, Hakan;Li, Yue Citation Chen, P.-Y., Erricolo, D., Shamim, A., Bagci, H., & Li, Y. (2019).

Dispersion and Field Control in a Metasurface-Implanted Waveguide. 2019 United States National Committee of URSI National Radio Science Meeting (USNC-URSI NRSM).

doi:10.23919/usnc-ursi-nrsm.2019.8712887 Eprint version Post-print

DOI 10.23919/USNC-URSI-NRSM.2019.8712887

Publisher Institute of Electrical and Electronics Engineers (IEEE) Rights (c) 2019 IEEE. Personal use of this material is permitted.

Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.

Download date 2024-01-24 19:08:09

Link to Item http://hdl.handle.net/10754/655963

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6FLHQFHDQG7HFKQRORJ\.$867 7KXZDO6DXGL$UDELD Abstract—Dispersion and cutoff frequency are essential

parameters for microwave waveguides and their versatile applicationsincommunicationandsensing.Inthiswork,we propose the concept of substrateintegrated impedance surface (SIIS) that enables arbitrary control of dispersion in closedshape waveguides and demonstrate that a substrateintegrated waveguide (SIW) loaded with a capacitiveSIIS(e.g.,anarrayofblind vias)doesnothave onlyareducedcutofffrequency,butalsoexhibitseffectsof slowwavepropagationandfieldlocalization.Theproposed SIIS technique may have broad relevance beyond miniaturization of waveguide components, as it may also open exciting prospects for ultrasensitive microwave sensingandenhancementofnonlinearpropertiesinactive waveguides.

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