• Tidak ada hasil yang ditemukan

Abstract content <br> &nbsp; (Max 300 words)<br><a href=”http://events.saip.org.za/getFile.py/access?resId=0&materialId=0&confId=34”

N/A
N/A
Protected

Academic year: 2023

Membagikan "Abstract content <br> &nbsp; (Max 300 words)<br><a href=”http://events.saip.org.za/getFile.py/access?resId=0&materialId=0&confId=34”"

Copied!
2
0
0

Teks penuh

(1)

SAIP2015

Contribution ID:249 Type:Poster Presentation

Evaluation of photovoltaic modules using standard electrical power measurements and imaging

techniques

Abstract content <br> &nbsp; (Max 300 words)<br><a href=”http://events.saip.org.za/getFile.py/access?resId=0&materialId=0&confId=34”

target=”_blank”>Formatting &<br>Special chars</a>

Photovoltaic (PV) characterisation techniques are quick and reliable tools to evaluate the performance of PV modules. Defects can be identified during visual inspection, electroluminescence (EL) imaging and ther- mographic inspection. These defects explain the reduced performance observed in the current-voltage (I-V) curves. It is important that these potential problem areas are detected to ensure efficient power generation and long life span of the module. In this study three different photovoltaic module technologies are used, namely monocrystalline, polycrystalline and Edge Defined Film-Fed Growth (EFG) silicon. These modules are subjected to the standard tests according to IEC 61215, as well as EL imaging and thermographic imaging.

The results obtained from each of the tests are evaluated in order to assess the performance of each module.

During visual inspection the modules are checked for any visible defects or failures according to the stan- dard test. The I V curves for each module are measured using an indoor solar simulator. These two standard tests provide a baseline of the module performance. EL imaging and thermal imaging techniques are used to identify defects and failures that are not visible during the visual inspection. In all the modules, defects were detected in the EL image that were not identified in the visual inspection. The performance of the module was limited by these defects as evident in the I-V curves. Potential hot-spots detected in thermal imaging could be attributed to cell mismatch within the module.

Apply to be<br> considered for a student <br> &nbsp; award (Yes / No)?

Yes

Level for award<br>&nbsp;(Hons, MSc, <br> &nbsp; PhD, N/A)?

Hons

Main supervisor (name and email)<br>and his / her institution

EE van Dyk

[email protected] NMMU

Would you like to <br> submit a short paper <br> for the Conference <br> Pro-

ceedings (Yes / No)?

(2)

No

Please indicate whether<br>this abstract may be<br>published online<br>(Yes / No)

Yes

Primary author: Ms RADEMEYER, Yvette (NMMU)

Co-authors: Prof. VAN DYK, Ernest (NMMU); Dr VORSTER, Frederik (NMMU); Ms CROZIER, Jacqui (NMMU)

Presenter: Ms RADEMEYER, Yvette (NMMU) Track Classification: Track F - Applied Physics

Referensi

Dokumen terkait

In this presentation, I will discuss the use of first principles calculations to explore how chemical identity, interface density and overlayer nanostructuring can be used to modulate

CCP2016 Contribution ID:60 Type:Poster Presentation The SAPBC method on local, non-cluster updates algorithms of Monte Carlo simulation: A study on more convergence of spin

CCP2016 Contribution ID:117 Type:Oral Presentation Learning problem-solving skills in a distance education physics course Monday, 11 July 2016 15:10 20 minutes Abstract content

AOIM2013 Contribution ID:37 Type:not specified Results on the high power testing of screen-printed deformable mirrors Wednesday, 4 September 2013 09:10 20 minutes Abstract content