140
141
microscopy images under white and UV light (at an excitation wavelength of 350 nm) were recorded by OLYMPUS BX 51 microscope fitted with a digital camera. The pH of the dispersions of QDCs and Qdots was measured using a JENWAY 3510- pH meter.
Chapter 4. A Hitachi U-2900 spectrophotometer and a HORIBA-Fluorolog 3 spectrofluorometer were used to record the UV−vis and PL spectra. Quantum yield and photostabilty of samples were measured using standard solutions of quinine sulfate (in 0.1 M H2SO4) and rhodamine 6G, respectively. Time-resolved photoluminescence (TRPL) analyses were carried out using Life-Spec-II spectrofluorometer (Edinburgh Instrument, using Pico Quant 375 nm LASER source), and the decay curves were analyzed by FAST software. The pH of the dispersions of the sample was measured using a JENWAY 3510 pH meter. A PerkinElmer (Model: Spectrum One) spectrophotometer was used for recording the FT-IR spectra of solid samples. The transmission electron microscopic (TEM), high resolution TEM (HRTEM), and selected area electron diffraction (SAED) pattern of the samples deposited on formvar- carbon-coated copper grids were recorded in a JEOL JEM-2100 transmission electron microscope (operated at a maximum accelerating voltage of 200 kV). The particle size distribution and inverse fast Fourier transform (IFFT) images were obtained by using Gatan Digital Micrograph software. A Bruker D2 Phaser X-ray diffractometer (having Cu Kα radiation at 1.5418 Å) was used to measure the XRD patterns of the powder samples. Thermal gravimetric analysis (TGA) was recorded by using a Mettler Toledo TGA/SDTA851e thermal analyzer in a nitrogen atmosphere, with a heating rate of 7
°C/min.
Chapter 5. Photoluminescence spectra were recorded using HORIBA-Fluorolg3 spectrofluorimeter. UV-Vis spectra were recorded with Hitachi U-2900 spectrophotometer.The pH of the dispersions of QDCs and Qdots was measured using a JENWAY 3510- pH meter. Quantum yield (Q.Y.) of sample was calculated by using quinine sulphate (Q.Y.= 54% in 0.1 M H2SO4) as a reference sample. Time resolved PL studies were performed by using Life-Spec-II spectrofluorimeter (Edinburgh Instrument, using Pico Quant 375 nm LASER and 308 LED source) and the decay patterns of the samples were analyzed by FAST software with the same instruments.
Rhodamine 6G was used as a standard for time dependent (up to 500 sec) photo
142
irradiation experiments.4 ESR (Electron Spin Resonance) spectra of the powder samples were recorded using JEOL FA 200 ESR spectrophotometer. FT-IR spectrophotometer (model: Spectrum Two) was used to analyze the solid samples. Zeta potential measurements of the colloidal dispersion were done using Malvern Zetasizer Nano ZS instruments. The XRD patterns of solid samples were measured using Brucker D2 Phaser X-ray diffractometer (having CuKradiation at 1.5418Å). TEM, high resolution TEM and SAED (selected area electron diffraction) analyses were done with JEOL JEM-2100 transmission electron microscope (operated at a maximum accelerating voltage of 200 kV).Using Gatan Digital Micrograph software inverse fast Fourier transform (IFFT) images were obtained from the same sample used for TEM analysis. TGA and DSC were recorded by using Perkin Elmer 4000 and Perkin Elmer 6000 instruments, respectively. OLYMPUS BX 51 microscope fitted with a digital camera was used to capture the images of solid samples under white and UV (with 350 nm excitation wavelength) light.
Chapter 6. The digital photographs of the samples were taken under UV light (365 nm) using a UV-lamp (Spectroline). The UV-Vis and PL spectra were recorded using Perkin Elmer Lambda-750 spectrometer and HORIBA-Fluoromax4 spectrofluorimeter, respectively. The JENWAY 3510- pH meter was used to measure the pH of the samples. The XRD patterns of the powder samples were measured using Brucker D8Advance X-ray diffractometer. The TEM, HRTEM and SAED pattern of the samples were recorded in a JEOL JEM-2100 transmission electron microscope (operated at a maximum accelerating voltage of 200 kV) following deposition of the aqueous dispersion on formvar-carbon-coated copper grids. The inverse fast Fourier transform (IFFT) images and particle size distribution were obtained by using Gatan Digital Micrograph software. The photostability of the samples were measured in Perkin-Elmer spectrofluorimeter with continuous irradiation of light and 0.1 sec data intervals. Time-resolved photoluminescence (TRPL) analyses were performed using HORIBA-JOBIN YVON FLUOROLOG spectrofluorimeter and using 340 nm LED excitation source with pulse width <1ns. To capture the images of the solid samples under white and UV (with 350 nm excitation wavelength) light, OLYMPUS BX 51 microscope fitted with a digital camera was used. The atomic absorption spectrometer (Varian AA240FS model) was used for elemental analysis of the aqueous dispersion of
143
the samples following their acid digestion. The FTIR spectra of the solid samples were recorded using Perkin-Elmer (Model: Spectrum One) spectrophotometer. Magnetic measurement of the samples was performed using a vibrating sample magnetometer (VSM; Model No. 7410 series). HeLa cells incubated with samples were imaged under an epi-fluorescence microscope (Nikon Eclipse TS100, Tokyo) using a Qdot 525 nm filter. Using Leica TCS SP8 STED (405 nm diode laser; magnification-60x oil immersion objective) microscope the confocal images of the samples were recorded.
Quantum Yield Determination. The quantum yield (QY) of the samples were calculated using quinine sulphate (in 0.1 M H2SO4) as standard and following equation:
2 2
s R S
s R
R S R
I A Q Q
I A
Where, QS = sample’s QY; QR = standard’s QY (0.54 in 0.1 M H2SO4); IS = area under the emission curve of sample; IR = area the emission curve of standard; AR = standard’s absorbance; AS = sample’s absorbance; S = refractive index of solvent which is used for dispersion of sample; R = refractive index of solvent which is used for dispersion of standard. The concentration of all samples and the standard were fixed followed by adjusting their absorbance to 0.1 + 0.01 at 369 nm.
Life time calculation. The decay profile was fitted to a multi-exponential model using following equation
Where, single, bi and tri exponential functions were used to fit respective emission with obtaining close to. The averaged life times (av) in Table S2, determined from the
results of three exponential model using
Where,i and i are the pre-exponential factors and excited-state luminescence decay time associated with the i-th component, respectively.
exp
it i
i
I t
(2)2 i i i av
i i i
(3)144
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