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A Report on the same has to be prepared and presented

Dalam dokumen MECHANICAL ENGINEERING (NANO TECHNOLOGY (Halaman 109-117)

Unit III Unit III

2. A Report on the same has to be prepared and presented

* Teachers may use their discretion to choose topics relevant and suitable to the needs of students.

* Not more than two students to work on each mini project.

* Students may be assessed by their performance both in oral presentation and written report.

JAWAHARLAL NEHRU TECHNOLOGICAL UNIVERSITY HYDERABAD III Year B.Tech. ME(NT)-II Sem L T/P/D C

4 -/-/- 4 (A60332) INDUSTRIAL MANAGEMENT

UNIT I

Management and Organisation – Functions of Management - Contributions of Taylor, Fayol, Douglas Mc-Gregor, Mayo Hertzberg and Maslow. – Systems Approach to Management - Organisational Structures: Basic concepts related to Organisation - Departmentation and Decentralisation, Types of mechanistic and organic structures of organisation and their merits, demerits and suitability.

UNIT II

Operations Management-I: Plant location, definition, factors affecting the plant location, comparison of rural and urban sites-methods for selection of plant- Matrix approach. Types of plant layout – various data analyzing forms- travel chart - Work study: Method study and Work measurement. Inventory – functions, types, Determination of Economic Order Quantity (EOQ), ABC and VED analysis. Inventory Control Systems-Continuous review system- periodical review system. Stores Management and Stores Records. Purchase management, duties of purchase of manager, JIT System.

UNIT III

Operations Management-II: Inspection and quality control, types of inspections - Statistical Quality Control-techniques- Charts for variables and attributes. Acceptance sampling plan- single sampling and double sampling plans-OC curves. Introduction to TQM-Quality Circles, ISO 9000 series procedures. Functions of Marketing, Marketing vs Selling, Marketing mix, Product Life Cycle.

Unit IV

Human Resources Management (HRM): Concepts of HRM, HRD and Personnel Management and Industrial Relations (PMIR), HRM vs PMIR, Basic functions of HR Manager: Manpower planning, Recruitment, Selection, Training and Development, Placement, Wage and Salary Administration, Promotion, Transfer, Separation, Performance Appraisal, Grievance Handling and Welfare Administration, Job Evaluation and Merit Rating – Capability Maturity Model (CMM) Levels – Performance Management System.

UNIT V

PERT / CPM: Project management, network modelling-probabilistic model, various types of activity time’s estimation-programme evaluation review techniques- Critical Path-probability of completing the project, Critical Path Method (CPM) - Project crashing. Simple problems.

TEXT BOOKS

1. Aryasri, Management Science, McGraw hill, 2012

2. Kumar,Rao and Chhalill : Introduction to Management Science, Cengage 2012.

REFERENCES:

1. Stoner, Freeman, Gilbert, Management, Pearson Education, New Delhi, 2012.

2. Amrine, Manufacturing Organization and Management, Pearson, 2012.

3. Chase, Jacobs, Aquilano, Operations Management, McGraw Hill, 2012.

2. Panner Selvam, Production and Operations Management, PHI, 2012.

3. Nadha Muni Reddy & Vijaya Kumar Reddy, Reliability Engineering &

Quality Engineering, Galgotia, 2012.

4. Ralph M Barnes, Motion and Time Studies, John Wiley and Sons, 2012.

5. L.S.Srinath, PERT / CPM, Affiliate East-West Press, New Delhi, 2012.

6. Gary Dessler, Human Resource Management, Pearson Education Asia, 2012.

7. Phillip Kotler, Marketing Management, Pearson, 2012.

8. S.K.Basu ,K.C.Sah u,B.Rajiv : In du strial Org an izatio n an d Management, PHI, 2012.

11 Dipak Kumar Bhattacharyya: Industrial Management, Vikas publishing house 2013.

JAWAHARLAL NEHRU TECHNOLOGICAL UNIVERSITY HYDERABAD III Year B.Tech. ME(NT)-II Sem L T/P/D C

4 -/-/- 4 (A60330) FINITE ELEMENT METHODS

UNIT – I:

Introduction to Finite Element Method for solving field problems. Stress and Equilibrium. Boundary conditions. Strain – Displacement relations. Stress – strain relations for 2-D and 3-D Elastic problems.

One Dimensional Problems: Finite element modeling coordinates and shape functions. Assembly of Global stiffness matrix and load vector. Finite element equations, Treatment of boundary conditions, Quadratic shape functions.

UNIT – II:

Analysis of Trusses: Stiffness Matrix for Plane Truss Elements, Stress Calculations and problems

Analysis of Beams: Element stiffness matrix for two noded, two degrees of freedom per node beam element and simple problems

UNIT – III:

Finite element modeling of two dimensional stress analysis with constant strain triangles and treatment of boundary conditions. Estimation of Load Vector, Stresses.

Finite element modeling of Axi-symmetric solids subjected to Axi-symmetric loading with triangular elements.

Two dimensional four noded Isoparametric elements and problems UNIT – IV:

Steady State Heat Transfer Analysis: one dimensional analysis of Slab, fin and two dimensional analysis of thin plate. Analysis of a uniform shaft subjected to torsion.

UNIT – V:

Dynamic Analysis: Formulation of finite element model, element - Mass matrices, evaluation of Eigen values and Eigen vectors for a stepped bar, truss.

Finite element – formulation to 3 D problems in stress analysis, convergence requirements, Mesh generation, techniques such as semi automatic and fully Automatic use of softwares such as ANSYS, NISA, NASTRAN, etc.

TEXT BOOKS:

1. The Finite Element Methods in Engineering / SS Rao / Pergamon.

2. Finite Element Methods: Basic Concepts and applications/ Alavala/

PHI.

REFERENCE BOOKS :

1. Introduction to Finite Elements in Engineering/Chandrupatla, Ashok and Belegundu/ Prentice – Hall.

2. Finite Element Method /Zincowitz / Mc Graw Hill.

3. Introduction to Finite element analysis/ S.Md.Jalaludeen/Anuradha Publications, print-2012.

4. A First Course in the Finite Element Method/Daryl L Logan/Cengage Learning/5th Edition.

5. Finite Element Method/Krishna Murthy / TMH.

6. Finite Element Analysis /Bathe / PHI.

JAWAHARLAL NEHRU TECHNOLOGICAL UNIVERSITY HYDERABAD III Year B.Tech. ME(NT)-II Sem L T/P/D C

4 -/-/- 4 (A62904) SYNTHESIS OF NANOMATERIALS

OBJECTIVES

1. To provide knowledge about top-down and bottom-up approaches for the synthesis of nanomaterials.

2. To enhance the various nanosynthesis techniques and to identify and solve problems

3. To design and conduct experiments relevant to nanochemistry, as well as to analyze the results.

4. To improve usage of synthesis methods for modern technology UNIT-I:

Introduction, Bottom-up approach: Sol-gel method,emulsion and Top-down:

ball milling approach with examples.

UNIT-II:

Physical methods: Inert gas condensation, Arc discharge, plasma synthesis, electric explosion of wires, molecular beam epitaxy, Physical Vapour Deposition, thermal evaporation, lithography and sputtering.

UNIT III:

Chemical methods: Nanocrystals by chemical reduction, photochemical syn th esis, elec troc hemical synthesis, c o-prec ip itatio n meth od . Semiconductor nanocrystals by arrested precipitation, sonochemical routes UNIT IV:

Biological methods – use of bacteria, fungi, actinomycetes for nano-particle synthesis nano-particles Solvated metal atom dispersion, Template based synthesis of nanomaterials.

Unit V:

Thermolysis route - spray pyrolysis, solvothermal and hydrothermal routes, solution combustion synthesis, Chemical vapor deposition

TEXTBOOKS:

1. Textb oo k of Nan oscien ce and Nan otec hn olog y – B.S.Murthy,P.Shankar, Baldev Raj,B.B.Rath and James Murday, University Press-IIM Series in Metallurgy and Materials Science.

2. A Textbook of Nanoscience and Nanotechnology – T.Pradeep, Tata McGraw Hill edition.

3. Nanostructures and Nanomaterials by Guozhong Cao

4. Inorganic Materials Synthesis and Fabrication by J.N. Lalena, D.A.

Cleary, E.E. Carpenter, N.F. Dean, John Wiley & Sons Inc.

5. Introduction to Nano Technology by Charles P. Poole Jr and Frank J.

Owens. Wiley India Pvt Ltd.

6. Th e Ch emistry of n an omaterials: Synthesis, Pro perties an d Applications, Vol-I by C.N.R. Rao, A. Muller and A.K. Cheetham 7. The Physics of Micro/Nano- Fabrication by Ivor Brodie and Julius

J.Muray REFERENCE BOOKS:

1. Encycloped ia of Nanotechnolo gy by M.Balakrishn a Rao and K.Krishna Reddy, Vol I to X, Campus books.

2. Encyclopedia of Nanotechnology by H.S. Nalwa

3. Nano : Th e Essentials – Und erstan ding Nan o Sc in ec e an d Nanotechnology – by T.Pradeep, Tata Mc.Graw Hill

OUTCOMES

To provide an abundant knowledge on various synthesis methods of nanomaterials.

JAWAHARLAL NEHRU TECHNOLOGICAL UNIVERSITY HYDERABAD III Year B.Tech. ME(NT)-II Sem L T/P/D C

4 -/-/- 4 (A62903) CHARACTERIZATION OF NANOMATERIALS Aim

To provide an overview of contemporary spectroscopy, microscopy, diffraction and analysis tools to characterize different properties of nanomaterials.

Objectives

1. To develop ability to understand modern characterization techniques especially utilized to probe in nanoscopic regime

2. To elucidate on application of standard spectroscopy, microscopy techniques for element analysis, structure analysis, depth profiling, topography imaging, as well as surface and interface analysis 3. To provide overview of principles underlying the characterization

methods and basic theory for analysis of the data obtained from the instrument

4. The objective of this course is to make the students understand the principles underlying various spectroscopies and instrumentations specific to nanomaterials

UNIT I:

Fundamentals of Electron Microscopy: Advantages of Electron Microscope over Optical Microscope (Magnification, Resolution,Depth of field). Theory and principle of Electron Microscope, Electron sources, Electron lenses (Electrostatic and Electromagnetic).

UNIT II:

Scanning Electron Microscopy: SEM: Theory of operation, Specimen- Beam interactions Importance of beam spot size, Machine variables, Scanning Electron Microscope (SEM). Specimen Preparation in SEM:

Special methods for various sample types – Biological sample preparation, Applications of SEM

UNIT III:

Transmission Electron Microscopy: TEM: Theory of operation, Modes of operation, Transmission Electron Microscope (TEM),Bright field Imaging, Electron diffraction, Dark field imaging, High Resolution TEM (HRTEM), Applications of TEM.

UNIT IV:

Atomic Force Microscopy: AFM: Basic concepts – Interactive forces, Principle and instrumentation, Force curves and force measurements, Modes of imaging: Tapping, contact and non-contact, Probes, Tip functionalization,

Unit V:

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