Both sides cut (0.5~0.7mm)
30 mT 60 mT 300 µm
Mechanical cutting process introduces defects !
PLD/IBAD tape
50 mm (length)
PLD/IBAD tape Photograph of specimen
MO image (30mT, ZFC 40K)
Defects at cut edges Defects at cut edges
Influence of mechanical cutting
機器応用の ための評価 機器応用の ための評価
IBAD/PLD tape with laser scribing
[SRL]
10 mT
20 mT
40 mT
10 mT
20 mT
40 mT
40 K 77 K
10 mT
20 mT
40 mT 65 K
Ic~250A
Slitting for reduction of alternating current losses
There is a few defect introduced by processing in comparison with mechanical processing.
Processing by laser beam ための評価
ための評価
3D image of scribing MO image
ZFC 20 mT 77 K
Enhanced by focusing effect
機器応用の ための評価 機器応用の ための評価
40 mT 40 K
IBAD/PLD tape with laser scribing Division into 10 parts
80 mT 40 K
A few defects were occurred.
ための評価 ための評価
80 mT 40 K
10 mm
機器応用の ための評価 機器応用の ための評価
Over current experiments carried out in Waseda Univ. Prof. Ishiyama.
Over current （＜ 600 K)
PLD Ag10µm
MOCVD (Chubu Electric)
Two kinds of defects were observed
MOI on over current samples
150 mm
Defect of the whole spreading
Defect through the length direction
ための評価 ための評価
Correspondence of MO images with fine texture
What is happen at the defects area detected by MOI ? The over current （ >600 K) applied to clarify what is changed.
V12 V23 V34 V45 V56 V67 V78
5 mT
10 mT
機器応用の ための評価 機器応用の ための評価
