Failure Analysis
Advanced Technologies
& Techniques
2 March 2021 | Tuesday | 2.00 pm MYT
DR. SUHAIRI SAHARUDIN Senior Staff Researcher
MIMOS
MS. SITI RAHMAH ESA Staff Engineer
MIMOS
DR. DAVID DONNET FIB Application
Specialist
Thermo Fisher Scientific
DR. ALEX BRIGHT TEM Application
Specialist
Thermo Fisher Scientific
EVENT BRIEF
The electrical and electronics (E&E) industry is expected to undergo rapid expansion and
diversification as well as maintain its position as the largest exporter of manufactured goods.
Continuous improvements of industry’s productivity performance will be encouraged to sustain the competitiveness of Malaysian E&E products in the global market.
This programme is specially designed for failure analysis professionals, academicians, and researchers towards providing detailed techniques and latest analysis tools in the market.
The selection of correct techniques and tools, and interpretation of data are vital for a successful process of identifying and resolving a failure.
We will be sharing various case studies and giving reviews on technologies and facilities offerings.
On top of that, we will explore on the TEM and STEM key technologies and discuss their importance for semiconductor device imaging and analysis applications. The talk will also provide a historical overview of the most popular Dualbeam applications and concentrate on the new applications made possible with a plasma ion source for both full wafer.
SPEAKER’S PROFILE
DR. SUHAIRI SAHARUDIN Senior Staff Researcher MIMOS
MS. SITI RAHMAH ESA Staff Engineer
MIMOS
Dr. Suhairi Saharudin has a Degree in Electrical and Electronics Engineering from the University of Strathclyde, Glasgow,
Scotland. He further pursued his Masters degree in Optical Electronics in 1992 and established his career path in this field for the following 20 years as a researcher at SIRIM Berhad and MIMOS Berhad. He obtained a Doctoral degree in Fiber laser research in 2006 from the Universiti Putra Malaysia.
He was among the founder of IEEE Photonics Society Malaysian chapter. He is also the Chairman of Fiber Optic Society of
Malaysia. He has accumulated 20 years of R&D experience and skills in the field of optical fiber communication systems, LASER and Optical Fiber Sensor. He joined MIMOS in 2005 to develop Quantum technology for information security. He is currently working on advanced microscopy and spectroscopy analytical equipment for fault identification in electronics.
Ms. Siti Rahmah Esa has a degree in Microelectronic Engineering from Universiti Malaysia Perlis (UNIMAP) and a Master in Science from University of Malaya (UM). She is
currently pursuing a PhD in advanced material characterisation from Universiti Teknikal Malaysia Melaka (UTeM).
She is currently a staff engineer for Material Analysis Lab at MIMOS Semiconductor (M) Sdn Bhd and is responsible for the lab operation to support the analytical services request from E&E Industries and universities. She has more than 12 years experience in Failure Analysis and Material Analysis field and previously worked for multinational company, Infineon Technologies Kulim.
Failure Analysis
Advanced Technologies
& Techniques
2 March 2021 | Tuesday | 2.00 pm MYT
DR. DAVID DONNET
FIB Application Specialist Thermo Fisher Scientific
DR. ALEX BRIGHT
TEM Application Specialist Thermo Fisher Scientific
Dr. David Donnet obtained his PhD from The University of Glasgow in Physics. He spent the initial part of his career studying magnetic materials for data storage in both academic and industrial laboratories in Netherlands and Japan.
He was a senior failure analysis engineer at Philips / NXP Semiconductors Netherlands from 2000 to 2010.
He joined Thermo Fisher Scientific (at that time FEI) as an applications specialist for FIB / Dual Beam in 2010 and
currently is Application Manager for semiconductor customers in the EMEA region.
Dr. Alex Bright is a TEM specialist in the Asia Pacific Materials Science Electron Microscopy team of Thermo Fisher Scientific.
Originally from Bristol in the UK, Alex holds a masters degree in Materials Science and a PhD in Electron Microscopy from Cambridge University. He worked in semiconductor device yield analysis at Micron Technology Japan before joining Thermo Fisher Scientific in 2005.
Since then he has worked on a variety of instruments including wafer dual-beam and automated measurement tools mainly on TEM. He has given many scientific presentations and written papers and articles on a variety of topics related mainly to TEM and STEM technology, techniques and applications.
He is currently based in Tokyo.
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