SAIP2013
Contribution ID:545 Type:Poster Presentation
Structural studies of Y and Zr doped nano-crystalline tin oxide using EXAFS and Raman Scattering
techniques.
Tuesday, 9 July 2013 17:40 (1 hour)
Abstract content <br> (Max 300 words)
Nanocrystals of Y and Zr doped SnO2 have been prepared by sol-gel route and annealed at 200, 400, 600, 800 and 1000 0C. The X-ray diffraction (XRD) results showed the average size of the particles in the freshly prepared samples to be ˜ 3 nm. The Extended Absorption Fine Structure (EXAFS) technique was used to study the dopant environments in nanocrystalline tin oxide. In all Y-doped samples, except the one annealed at 1000 0C, there is clear evidence that Y has not entered the SnO2 lattice. This is clearly supported by the Raman scattering results. In all Zr-doped samples, there is a simple substitution for Sn by Zr.
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Would you like to <br> submit a short paper <br> for the Conference <br> Pro- ceedings (Yes / No)?
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Primary author: Prof. RAMMUTLA, Erasmus Koena (University of Limpopo)
Co-authors: Prof. CHADWICK, AV (University of Kent, School of Physical Sciences, Canterbury, UK); Dr ERASMUS, RM (University of the Witwatersrand, School of Physics, Johannesburg, 2050, RSA)
Presenter: Prof. RAMMUTLA, Erasmus Koena (University of Limpopo) Session Classification: Poster1
Track Classification: Track A - Division for Condensed Matter Physics and Materials
