Design Of Microcode Memory Built-In Self Test.
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High indicates a write transfer, and low a read transfer 1 WRITE Size of transfer: byte, half word or word 3 SIZE Indicates if the transfer forms part of a burst 3 BURST
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Deductive Fault Simulation: Example Step-4: LOG3={ I10, OG31} fault deduction at a 2-input AND gate with both inputs as 0 Fault list detected at output of the AND gate comprise i
Scan Chain based Testing and ATPG for sequential circuits Flip-flops in scan chain mode Scan in Mux mode=1 D Q clock Scan in Mux mode=1 D Q clock normal input from NSF
March Test: Coupling Faults Inverting rising coupling fault | between cell i coupled cell and j coupling cell: i Cell j is to be written with a 0 and read back, ii value at cell
