• Tidak ada hasil yang ditemukan

Chau QWFET ICSICT foils 102004

N/A
N/A
Protected

Academic year: 2017

Membagikan "Chau QWFET ICSICT foils 102004"

Copied!
14
0
0

Teks penuh

(1)

®

Novel InSb-based Quantum Well

Transistors for Ultra-High Speed,

Low Power Logic Applications

Suman Datta and Robert Chau

Intel Corporation, USA

In collaboration with

QinetiQ, Malvern Technology Center, UK

(2)

QinetiQ Team

T. Ashley, A. R. Barnes, L. Buckle, A. B.

Dean, M. T. Emeny, M. Fearn, D. G.

Hayes,K. P. Hilton, R. Jefferies, T. Martin,

K. J. Nash, T. J. Phillips, W. H. A. Tang

and P. J. Wilding

(3)

®

Outline

Introduction

InSb as High Mobility Channel Material

InSb Materials Growth and Results

InSb QW Transistor Fabrication

Device Characterization and Results

Benchmarking of InSb based Transistors to

Silicon based Transistors for Logic

Applications

(4)

Channel Material Properties at

295K

InSb shows the highest room temperature

mobility, but also the lowest energy band-gap

Si GaAs In.53Ga.47As InAs InSb

Electron Mobility (cm2V-1s-1) ns=1x1012/cm2)

600 4,600 7,800 20,000 30,000

Electron Saturation

Velocity (107cm/s) 1.0

1.2 0.8 3.5 5.0

Ballistic Mean

Free Path (nm) 28 80 106 194 226

Energy

(5)

®

InSb Quantum Well Transistor and

Multi-layer Epitaxial Structure

Non Self-aligned Ohmic contacts

Schottky Barrier Metal

S.I. GaAs substrate for epitaxial growth

Remote Doping

Layers

High electron mobility InSb quantum well

Higher band-gap

matrix AlxIn1-xSb

for reduced junction leakage

metamorphic AlInSb buffer layer

Layer Material Thickness (nm)

Top Barrier Al

xIn1-xSb 15-45

Doping Te

-Spacer Al

xIn1-xSb 5

Channel InSb 20

Metamorphic

Buffer AlyIn1-ySb 3,000

Substrate GaAs

Carriers are confined within the InSb quantum well for transport

(6)

Hall Mobility of Doped versus

Modulation Doped InSb Channel

Thicker buffer layer improves InSb QW mobility

Modulation doping with Al.15In.85Sb barrier layer improves mobility only at low carrier densities.

0 10000 20000 30000 40000

0 5E+11 1E+12 1.5E+12 2E+12

Sheet carrier density (cm-2)

Carrier mobility (cm

2 V -1 s -1 )

Doped Channel on 1 µm AlInSb buffer

Doped Channel on 3 µm AlInSb buffer

(7)

®

Schrödinger Poisson Simulation of

Carrier Confinement in QW

0 20 40 60 80 100

Depth (nm)

Energy (eV)

0 20 40 60 80 100

Depth (nm)

Energy (eV)

15% Al barrier 30% Al barrier

Eo

E1

E1

Eo

Higher conduction band offset barrier results in

(8)

Hall Mobility of Modulation Doped

InSb Quantum Well

Sheet carrier density (cm-2)

Carrier mobility (cm

2 V -1 s -1 )

0 10000 20000 30000 40000

0 5E+11 1E+12 1.5E+12 2E+12

Remote doped in 15% Al barriers

Remote doped in 20% Al barriers

Remote doped in 30% Al barriers

Bulk InSb (20nm well)

Room temperature InSb QW mobility over 30,000 cm2V-1s-1

(9)

®

InSb QW Transistor Fabrication

Gate

Drain Voltage, VDS(V)

Drain Current

(mA/

µ

m) VGS = 0 V

A two gate finger InSb QW transistor (LG=200nm ) fabricated with gate air-bridge using mesa isolation

(10)

InSb QW Transistor DC

Gate voltage (V)

Drain and Gate Current (

mA

Drain Current Gate Current Gm

Gate voltage (V)

Drain and Gate Current (

mA

Drain Current

Gm

VDS=0.5, 0.05V

Peak gm of 900 µS/µm is obtained with 200nm LG devices

(11)

®

InSb QW Transistor High Frequency

Characteristics

fT = 150GHz

fmax ~ 190GHz

0 10 20 30 40

0.1 1 10 100 1000

Frequency (GHz)

Gain (dB)

h21

MSG/MAG

Ug

VDS = 0.5V, V GS = -0.4V

fT = 150GHz

fmax ~ 190GHz

fT = 150GHz

fmax ~ 190GHz

Unity gain cut-off frequency, fT ~ 150GHz is achieved with 200nm LG InSb QW transistor

(12)

Performance and active Power

Dynamic Power Dissipation (µW/µm)

Cut-off Freque

ncy, f

Increasing VDS 1.2 V

1.0 V 0.7 V

(13)

®

Gate Delay vs Gate Length

0.1 1 10 100

1 10 100 1000 10000

Gate Length, LG (nm)

Gate Delay, CV/I (ps)

Si MOSFETs

InSb QW Transistors

NMOS

InSb QW transistors provide 5X improvement in intrinsic gate delay over Si transistors at similar LG

(14)

Conclusions

Room temperature mobility of 30,000 cm2V-1s-1 has

been achieved with InSb quantum well.

InSb QW transistors are demonstrated to operate in depletion mode at 0.5V VDS (0.5V VGS swing), with an Ion-Ioff ratio ~ 80 and fT ~ 150 GHz

InSb QW transistors (LG = 200nm) show equivalent high frequency performance as Si transistors (LG = 80nm) with 10X lower active power dissipation

Schottky gate leakage sets the Ioff limit for the InSb QW transistors

Referensi

Dokumen terkait