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S-Parameter Measurements with the 6-Port Network Analyzer

Chapter 3. Six-Port Network Analyzer Theory

3.3 S-Parameter Measurements with the 6-Port Network Analyzer

3.3 S-Parameter Measurements with the 6-Port Network Analyzer

_____ ..,. Divider ...---,,,

~,p..;;;.;;._~

6-Port #1 6-Port #2

Figure 3.6 A full 5-parameter measurement system using six-port network analyzers.

With equation (3.99), then, a2f a1 can be determined from the observed r's for any measurement. The remaining difficulty is to find the values of the C's.

This can be done by noting that equation (3.98) is linear in the C's. Using at least three known values of r I, r 2 and a2f a1, a system of linear equations is formed which can be solved for the C's.

The values of the r's to plug into this set of equations are, of course, directly available from the measurements. The values of a2f a1 must be derived somewhat indirectly. This is done by measuring a set of calibration standards for which the S-parameters are approximately known. A set of precision transmission lines of approximately known length is a common choice. These lines are reciprocal, and so their complete S-parameters can be found from the knowledge of Sn, S22 and

.6.

which is found as noted above.

IS12 I = IS21 I =

v'l.6. -

Sn S22 I (3.100)

arg( .6. - S1 i S22) arg(S12) = arg(S12) =

2

+

mr (3.101)

The mr in equation (3.101) results from the sign ambiguity of the square root.

Since in this case, the length of each of the calibration standards is approximately known, this sign ambiguity can b_e resolved by calculating the expected value of arg(S12 ) and choosing the sign that gives the value closest to this.

With all the S-parameters for the calibration standards thus measured, equa- tions (3.95) or (3.96) can be used to find a2/ a1 for each measurement, and de- termination of the values of the C's can proceed.

The values of the C's change when the phase shifter or variable attenuators are switched. Thus C's must be calculated and stored for all possible configura- tions of the measurement system.

After all calibration has been completed, measurement of the S-parametcrs of an unknown two-port proceeds as follows: the measurement system is stepped through all combinations of the phase shifter and attenuator positions and the

values of the I''s resulting are stored. These are then summed into a matrix and least-squares estimates of S11 , S22 and 6. for the unknown network are determined through a set of equations like (3.52). Then the C's are used to find az/a1 for each of the measurement configurations, and calculate S12 and S21 by solving equations (3.95) and (3.96), respectively. The resulting values of S12 and S21 , respectively, are averaged to yield the final estimates of these quantities.

This is the general procedure. If it is known that the two-port being mea- sured is reciprocal, then greater accuracy can be achieved by using (3.100-3.101) to find S12 _ S21 . Then the results from (3.95-3.96) and (3.99) can be used only to resolve the sign ambiguity in (3.101).

By changing the positions of the variable attenuators, the value of

az/ a

1

can be made arbitrarily large or small. This can be used to advantage in some measurement situations. In measuring an amplifier, for example, the signal on the output side of the amplifier is at a much higher level than that on the input side. Most six-port reflectometers have their best accuracy when measuring values of

r

for which

1r1 <

1. By making la2/ a1

I

approximately equal to the gain of the amplifier, ratios near unity will be measured by both the input and output reflectometers.

In summary, two six-port reflectometers can be combined in a system that can measure the full S-parameters of unknown two-ports. This system has none of the switch-dependency problems that can occur with the four-port-based sys- tems. As long as the various switches (attenuators and phase shifters) in the six-port system are repeatable, their effects are calibrated out.

References

[1] G.F. Engen, "Calibration of an arbitrary six-port junction for measurement of active and passive circuit parameters," IEEE Trans. Inst. Meas., vol. IM-22, no. 4, pp. 295-299, Dec. 1973

[2] G.F. Engen, "The six-port reflectometer: An alternative network analyzer,"

in 1977 IEEE Mtt-S Int. Microwave Symp. Dig., June 1977, pp. 44-45, 53-55 [3] G.F. Engen, "Calibrating the six-port refl.ectometer by means of sliding

terminations," IEEE Trans. Microwave Theory Tech., vol. MTT-26, no. 12, pp. 951-957,Dec. 1978

[4] CRC Standard Math Tables, Boca Raton, FL: CRC Press, Inc.

[5] G.F. Engen, "An improved circuit for implementing the six-port technique of microwave measurements," IEEE Trans. Microwave Theory Tech., vol. MTT- 25, no. 12, pp. 1080-1083, Dec. 1977

[6] G.F. Engen and C.A. Hoer, "'Thru-reflect-line': An improved technique for calibrating the dual six-port automatic network analyzer," IEEE Trans.

Microwave Theory Tech., vol. MTT-27, no. 12, pp. 987-993, Dec. 1979

[7] C.A. Hoer, "A network analyzer incorporating two six-port reflectometers,"

IEEE Trans. Microwave Theory Tech., vol. MTT-25, no. 12, pp. 1070-1074, Dec. 1977

(8] C.A. Hoer, "Performance of a dual six-port automatic network analyzer,"

IEEE Trans. Microwave Theory Tech., vol. MTT-27, no. 12, pp. 993-998, Dec. 1979

[9] C.A. Hoer, "Using six-port and eight-port junctions to measure active and passive circuit parameters," Nat. Bur. Stand. Tech. Note 673, Sept. 1975 [10] G.F. Engen, "A least squares solution for use in the six-port measure-

ment technique," IEEE Trans. Microwave Theory Tech., vol. MTT-28, no. 12, pp. 1473-1477, Dec. 1980

[11 C.A. Hoer and ICC. Roe, "Using an arbitrary six-port junction to measure complex voltage ratios," IEEE Trans. Microwave Theory Tech., vol. MTT-23, pp. 978-984, Dec. 1975

[12] I. Kasa, "Closed-form mathematical solutions to some network analyzer cal- ibration equations," IEEE Trans. Instrum. Meas., vol. IM-23, no. 4, pp. 399- 402, Dec. 1974

[13] H.M. Cranson and L. Susman, "A six-port automatic network analyzer,"

IEEE Trans. Microwave Theory Tech., vol. MTT-25, no. 12, pp. 1086-1091, Dec. 1977

[14] M.P. Weidman, "A semiautomated six-port for measuring millimeter-wave power and complex reflection coefficient," IEEE Trans. Microwave Theory

Tech., vol. MTT-25, no. 12, pp. 1083-1085, Dec. 1977

(15] G.F. Engen and C.A. Hoer, "Application of arbitrary six-port junction to power measurement problems," IEEE Trans. Instrum. Meas., vol. IM-21, pp. 470-474, Nov. 1972

[16] G.F. Engen, "Determination of microwave phase and amplitude from power measurements," IEEE Trans. Instrum. Meas., vol. IM-25, no. 4, pp. 414--418, Dec. 1976

[17] H.M. Altschuler, "The measurement of arbitrary linear microwave two-ports," Proc. Inst. Elec. Eng., vol. 109, pt. B. suppl., no. 23, pp. 704-712, May 1962

[18] C.A. Hoer, KC. Roe and C.M. Allred, "Measuring and minimizing diode de- tector nonlinearity," IEEE Trans. Instrum. Meas., vol. IM-25, no. 4, pp. 324- 329

[19] C.M. Allred and C.H. Manney, "The calibration and use of directional cou- plers without standards," IEEE Trans. Instrum. Meas., vol. IM-25, no. 1, pp. 84-89, Mar. 1976

(20] G.F. Engen, "An overview of the six-port measurement technique," in 1978 IEEE MTT-S Int. Symp. Dig., pp. 174-175

(21] C.A. Hoer, "Calibrating two six-port reflectometers with an unknown length of precision transmission line," in 1978 IEEE MTT-S Int. Symp. Dig., pp. 176- 178

(22] L. Susman, "A new technique for calibrating dual six-port nebvorks with application to s-parameter measurements," in 1978 IEEE MTT-S Int. Symp.

Dig., pp. 179-181

(23] G.F. Engen, "Calibrating the six-port refiectometer," in 1978 IEEE MTT-S Int. Symp. Dig., pp. 182-183

(24] G.F. Engen, C.A. Hoer and R.A. Speciale, "The application of 'thru-short- delay' to the calibration of the dual six-port," in 1978 IEEE MTT-S Int. Symp.

Dig., pp. 184-185