IV. Simulation and Analysis 14
4.5 Transient Simulation Result
Fig. 4.10 is the result of transient simulation comparing PT-STI and PD-STI. The load capacitance is 0.1 pF and doping profiles of pn junction are P+doping concentration is 2E20 [#/cm3] and the n- well doping concentration is 8E19 [#/cm3]. Width and length of nmos are 1µm and 1µm. Width and length of pmos are 2 µm and 1 µm. The difference in width between nmos and pmos is due to the difference in mobility between electrons and holes. Width and length of diode are 0.35µm and 0.35 µm. This transient simulation is carried out with operating frequency of 5MHz. We can see when the input voltage is halfVDD, PD-STI converges more stably to halfVDD. In addition, the overall transition speed of PD-STI is faster than PT-STI. In particular, it should be noted that when the output voltage goes from state ’0’ to state ’2’, PD-STI is 4.4 ns faster compared to PT-STI. This results are indicating that PD-STI is more suitable for binary-ternary hybrid operation.
I compared PT-STI and PD-STI as Power Delay Product, which is an indicator of the energy efficiency of logic circuits. The device size and doping profile are the same as in the previous slide. These were simulated at load capacitance is 0.1 pF and operating frequency is 10MHz. In the Fig. 4.11, Black line is input voltage, blue line is output voltage of PT-STI and red line is output voltage of PD-STI. As you can see, PD-STI respond faster compared to PT-STI. The results (Table 4.3) show that the average power is almost the same, but the delay has been reduced from 10.8 ns to 6.97 ns. As a result, PD-STI realized a PDP reduction approximately 38% compared to PT-STI.
Figure 4.11:Comparison of transient simulation results with PT-STI and PD-STI at 10MHz.
STI Average Power (µW) Worst Delay (ns) Power-Delay Product (fJ)
PT-STI 2.018 10.8 21.79
PD-STI 1.949 6.97 13.58
Table 4.3: Comparison of energy efficiency as PDP of PT-STI and PD-STI.
Finally, Fig. 4.12 shows the delay improvement result at the minimal gate length of 110-nm technol- ogy node. By applying minimal gate length, the overall delay is reduced due to the increase of device current. The worst delay of minimal gate length case is 2.5 ns and the worst delay of 1µm gate length case is 6.97 ns. we can notice that the worst delay is greatly reduced by device gate length scaling. Table 4.4 shows that PDP of the minimal gate length case improves approximately three times compared to 1µm gate length at 10MHz.
Figure 4.12: Comparison of transient simulation results with 1µm gate length and minimal gate length at 10MHz.
W / L Average Power (µW) Worst Delay (ns) Power-Delay Product (fJ)
1µm / 1µm 1.949 6.97 13.58
1µm / L
MIN1.76 2.5 4.4
Table 4.4:Comparison of energy efficiency as PDP of 1µm gate length and minimal gate length.
Chapter V
Further Works
Demonstration of PD-STI operation
Tape-out was carried out doping profile split and area split of pn junction with 1µm gate length and minimal gate length of MOSFET. The top view of PD-STI split is shown in Fig. 5.1 and composed of three sections; PT-STI for reference, PD-STI with normal pn diode, and PD-STI with additionally doped pn diode. After the fabout of DB-Hitek 110-nm CMOS foundry fabrication expected between February and March, PD-STI will be demonstrated by measuring characteristics.
Figure 5.1:DB-Hitek 110-nm CMOS foundry fabrication top view of PD-STI split.
3D stacked design by fabricating PN junction under(or upper) the CMOS
Due to the limits of the device scaling and economic feasibility, 3D stacked IC such as heteroge- neous integration and monolithic 3D (M3D) integration are being extensively studied [17], [18] for a breakthrough to achieve ”More Moore and More Than Moore”. In accordance with this flow, if the pn junction capable of low-temperature fabrication can be fabricated in 3D upper or under the CMOS, as shown in Fig. 5.2, the top view area is reduced. In addition, the interconnect wire length can be greatly reduced, thereby realizing latency improvement and power reduction [19].
Figure 5.2:Top view area reduction by forming pn junction under or upper CMOS.
Chapter VI
Conclusion
In order to overcome the power density limit faced by binary-based devices, ternary-based logic system would be a novel technology for the most effective and fundamental solution.
In this thesis, I have proposed a novel standard ternary inverter (STI) circuit design (PD-STI) using 4 transistors and 2 pn junctions based on Si-CMOS technology for compact STI design. Replacing pass transistors (4 terminal device) of PT-STI with pass pn junctions (2 terminal device), reduced the number of interconnects and required VT H. To solve transient operation issue of failing to respond to the input frequency, heavily doped pn junction was exploited, allowing STI to operate at 10MHz.
From the theoretical validation and numerical simulation, PD-STI operation have been verified. I had characterized the remarkable PDP enhancement compared to previous research.
Finally, the proposed STI design; PD-STI can simplify existing STI design using 6 transistors. Fur- thermore, compact design is possible through a monolithic 3D integration or heterogeneous integration.
The proposed PD-STI provides a promising route for future electronic device and circuit in multi- valued logic to break through peta-level information density in the era of the 4thIndustrial Revolution.
References
[1] Gordon E Moore. Cramming more components onto integrated circuits. Proceedings of the IEEE, 86(1):82–85, 1998.
[2] Victor V Zhirnov, Ralph K Cavin, James A Hutchby, and George I Bourianoff. Limits to binary logic switch scaling-a gedanken model.Proceedings of the IEEE, 91(11):1934–1939, 2003.
[3] Chris Auth, C Allen, A Blattner, D Bergstrom, M Brazier, M Bost, M Buehler, V Chikarmane, T Ghani, T Glassman, et al. A 22nm high performance and low-power cmos technology featuring fully-depleted tri-gate transistors, self-aligned contacts and high density mim capacitors. In2012 symposium on VLSI technology (VLSIT), pages 131–132. IEEE, 2012.
[4] S Natarajan, M Agostinelli, S Akbar, M Bost, A Bowonder, V Chikarmane, S Chouksey, A Das- gupta, K Fischer, Q Fu, et al. A 14nm logic technology featuring 2 nd-generation finfet, air-gapped interconnects, self-aligned double patterning and a 0.0588µm 2 sram cell size. In2014 IEEE In- ternational Electron Devices Meeting, pages 3–7. IEEE, 2014.
[5] N Singh, A Agarwal, LK Bera, TY Liow, R Yang, SC Rustagi, CH Tung, R Kumar, GQ Lo, N Balasubramanian, et al. High-performance fully depleted silicon nanowire (diameter/spl les/5 nm) gate-all-around cmos devices.IEEE Electron Device Letters, 27(5):383–386, 2006.
[6] David Bol, Renaud Ambroise, Denis Flandre, and Jean-Didier Legat. Interests and limitations of technology scaling for subthreshold logic. IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 17(10):1508–1519, 2009.
[7] Vincent Gaudet. A survey and tutorial on contemporary aspects of multiple-valued logic and its application to microelectronic circuits.IEEE Journal on Emerging and Selected Topics in Circuits and Systems, 6(1):5–12, 2016.
[8] Stanley L. Hurst. Multiple-valued logic : Its status and its future.IEEE transactions on Computers, 33(12):1160–1179, 1984.
[9] Sunmean Kim, Sung-Yun Lee, Sunghye Park, Kyung Rok Kim, and Seokhyeong Kang. A logic synthesis methodology for low-power ternary logic circuits. IEEE Transactions on Circuits and Systems I: Regular Papers, 67(9):3138–3151, 2020.
[10] Jie Deng and H-S Philip Wong. A compact spice model for carbon-nanotube field-effect transistors including nonidealities and its application—part i: Model of the intrinsic channel region. IEEE Transactions on Electron Devices, 54(12):3186–3194, 2007.
[11] Jie Deng and H-S Philip Wong. A compact spice model for carbon-nanotube field-effect transistors including nonidealities and its application—part ii: Full device model and circuit performance benchmarking. IEEE Transactions on Electron Devices, 54(12):3195–3205, 2007.
[12] Sheng Lin, Yong-Bin Kim, and Fabrizio Lombardi. Cntfet-based design of ternary logic gates and arithmetic circuits. IEEE transactions on nanotechnology, 10(2):217–225, 2009.
[13] Alex Heung and HT Mouftah. Depletion/enhancement cmos for a lower power family of three- valued logic circuits. IEEE Journal of Solid-State Circuits, 20(2):609–616, 1985.
[14] Youngchang Choi, Sunmean Kim, Kyongsu Lee, and Seokhyeong Kang. Design and analysis of a low-power ternary sram. In2021 IEEE International Symposium on Circuits and Systems (ISCAS), pages 1–4. IEEE, 2021.
[15] Leo Esaki and Ray Tsu. Superlattice and negative differential conductivity in semiconductors.
IBM Journal of Research and Development, 14(1):61–65, 1970.
[16] Jae Won Jeong, Young-Eun Choi, Woo-Seok Kim, Jee-Ho Park, Sunmean Kim, Sunhae Shin, Kyuho Lee, Jiwon Chang, Seong-Jin Kim, and Kyung Rok Kim. Tunnelling-based ternary metal–
oxide–semiconductor technology.Nature Electronics, 2(7):307–312, 2019.
[17] T Srimani, G Hills, M Bishop, C Lau, P Kanhaiya, R Ho, A Amer, M Chao, A Yu, A Wright, et al. Heterogeneous integration of beol logic and memory in a commercial foundry: Multi- tier complementary carbon nanotube logic and resistive ram at a 130 nm node. In 2020 IEEE Symposium on VLSI Technology, pages 1–2. IEEE, 2020.
[18] Max M Shulaker, Tony F Wu, Mohamed M Sabry, Hai Wei, H-S Philip Wong, and Subhasish Mitra. Monolithic 3d integration: A path from concept to reality. In2015 Design, Automation&
Test in Europe Conference&Exhibition (DATE), pages 1197–1202. IEEE, 2015.
[19] Yuan Xie. Processor architecture design using 3d integration technology. In2010 23rd Interna- tional Conference on VLSI Design, pages 446–451. IEEE, 2010.
Acknowledgement
First of all, I would like to appreciate committee professors,
Prof.
Kyung Rok Kim,Prof.
Seong-Jin Kim, andProf.
Myungsoo Kim for giving meaningful interactions and advice on my master’s degree thesis defense.I would like to express my deep and sincere gratitude to my advisor,
Prof.
Kyung Rok Kim. My professor have emphasized self-motivation that comes from own curiosity to step forward to the next level. My professor’s infinite stimulation that arouses curiosity and motivation pushed me to sharpen my thinking and brought my work to a higher level. Thanks to a great professor, my master’s degree course was very meaningful and it led me to the next level of Ph.D. course.I would like to express my gratitude to the all members of
NEEDs Lab
,Dr.
Min Woo Ryu, Sang Hyo Ahn, Youngeun Choi, Woo-Seok Kim, Yu Bin Song, Myoung Kim, Seung Woo Hong, and Minjae Kim who give warm advice and brilliant questions. Thanks to them, I was not lonely, I was able to overcome difficulties about private matters and break through when I was blocked from research. In particular, I would like to thankDr.
Min Woo Ryu for giving me a lot of research and life advice in a comfortable place, and I would like to thank Sang Hyo Ahn for being a strong supporter with reliable and warming care. Although two years was a short time, I could definitely tell they have been and always will be really good people.Also, thank you for excellent alumni,
Dr.
Jong Yul Park,Dr.
Sung Ho Kim,Dr.
E-San Jang, andDr.
Jae Won Jeong for being a good example of a passionate researcher. I learned where and how to go on a path of a researcher by looking at their footsteps.Last, but not least, I would like to express my special thanks to my parents, Woo Seong Jun and Nam Young Jung for giving birth to me in the first place and supporting me spiritually throughout my life with their endless love and encouragement, and I also thank you to my sister Soo Jin Jun and my twin Hye Bin Jun for their unconditional support.
With this in mind I will dedicate myself harder in the future.
Dec. 24. 2021.
Jae Hyeon Jun
Curriculum Vitae
Jae Hyeon Jun
Email : [email protected] Mobile :+82-10-7257-5770 Birthday : November 20th, 1997
Address : Engineering Building 106-602,
50 UNIST-gil, Ulsan 44919, Republic of Korea
Education and Experiences
Mar. 2020 ∼ Feb. 2022 M.S.in Department of Electrical Engineering, UNIST, Korea
Advisor: Prof. Kyung Rok Kim ([email protected], http://NEEDs.org) Mar. 2016 ∼ Feb. 2020 B.S.in Electrical and Computer Engineering, Ajou University, Korea Mar. 2013 ∼ Feb. 2016 Gyeongsan High School, Gyeongsan City, Korea
Domestic Conference Presentaions
• 2022 KCS:
Jae Hyeon Jun, Young Eun Choi, Woo-Seok Kim, Seung Woo Hong, Myoung Kim, Su Hyeon Jo, and Kyung Rok Kim,
“Design of Pass Diode-Based Low-Power Ternary Inverter Circuit”, The 29th Korea Conference on Semiconductors, Jan.24-26, 2022
• 2021 KCS:Poster presentation
Jae Hyeon Jun, Jae Won Jeong, Young Eun Choi, Woo-Seok Kim and Kyung Rok Kim,
“Analysis and Characterization of Pass Transistor-Based Ternary Inverter for Optimized Low- Power Design ”,
The 28th Korea Conference on Semiconductors, Feb.25-29, 2021
Patents
• [KR Applied, 10-2021-0084150] 3진수
논리회로
(CNT기반)
Inventors: Kyung Rok Kim, Jae Won Jeong, Young Eun Choi,Jae Hyeon Jun