I
Instilule of Ftl*fgrcduafe
$tudims
U
niversi*i
$ttinx
Mu
loXrsio
ffiitmm;
U*r*&n srilr M&r*ra
s-'d{ s ),*,
*,ru,,, :**r.*
FrmmffiffiWffiHeWffi
rlf
sYttlP0$tultr
oIU$HI
lellowshin
llolilers
2000
Psnsng,
lllalrusia
t4.1S
Houumfttr Z0llS
in
co$ahoratiort
witfr
Proceedings of Symposium of USM Fellowship Holders 2009
14-15 November 2009, Universiti Sains Malaysia, penang, Malaysia
STRUCTURAL REFINEMENT OF SAMARIUM BISMUTH TITANATE USING RIETVELD METHOD
Umar Al-Amani Azlan
School of Materials & Mineral Resources Engineering Universiti Sains Malaysia, 14300, penang
ibnu azlan200 5 @ g m a i l. co m
Ahmad Fauzi Mohd Noor
School of Materials & Mineral Resources Engineering Universiti Sains Malaysia, 14300, penang
Srimala Sreekantan
School of Materials & Mineral Resources Engineering Universiti Sains Malaysia, 14300, penang
ABSTRACT
The crystal structure of Bismuth titanate (BT) and Samarium Bismuth titanate (SBT)
was analyzed using Rietveld method. Through the analysis, we found that the orthorhombic structure
of
BT was gradually changedto
bea
tetragonal structure which belongsto
theSBT'
A
great influence was clearly seen on the crystal structureas
a
resultof
Samarium content added to the system. Other parameters such as lattice parameter, volume unit andcrystallite size were also changed due to such addition.
Keywords: Bismuth titanate, Samarium, Structural
INTRODUCTION
Bismuth titanate, (Bi4Ti3O12) or generally called BT is
a
ferroelectric material whichhas
a
perovskite structure t1l. BT alsois the
promising candidatefor
potential use in the applicationof
ferroelectric random access memory (FRAM) owingto
its
large
remnantpolarization, good fatigue properties on metal electrodes and excellent dielectric properties.
However, BT compound exhibits relatively high leakage current, domain pinning and small remanent polarization, which makes it difficult
to
use BTfor
real device applications tri" lnprevious studies revealed that trivalent cations
of
lanthanide (e.g. La3*, Nd3*, Sm3*" pr3*)have attracted much attention due
to
their ferroelectric properties were inthe
reasonableranges
for
memory applicationt3l" Amongthese, sm3.
10.117nm) ions were used
tosubstitute Bi3.(0.108 nm) ions in BT due to larger of their ionic size difference tal. lt is known
that the degree of enhancement of remanent polarization in BT is governed by the difference between ionic sizes of Bi3* and the Sm3* ions. Thus, the larger the ionic size difference, the
lgtrgllE
polarizationwill
be.
ln
the
present study,we
adoptedthe
Rietvetd method toWrxwr
m
'"..{., tas.ruFhu,^r $}n^r^n
urfilmsfls{lNSMIIA}S* .
Proceedings of Symposium of USM Fellowship Holders 2009
14-15 November 2009, Universiti Sains Malaysia, Penang, Malaysia
investigate
the
crystal
structureof
samarium substituted bismuthtitanate (SBT).
lt
isnecessary to study this method on such parameter of SBT as it has not been performed yet. Due to this reason, therefore we have reported this work throughly in this paper"
EXPERIMENTAL PROCEDURE
The sample was prepared by a modified combustion synthesis using B|(NO3)3.5H2O,
Sm(NO3)3,6HzO
and
Ti[OCH(CHs)z]+as the
starling materials.The
powder mixture was calcined at 800oC for3
h and then, the powder was ground by agate mortar to obtain fine powder.The
processwas
consistently repeatedfor
other samples" These samples were afterward sentto
X-ray diffraction (XRD) (Bruker DB Advanced)and
analyzed by Rietveld method. The parameters setting forXRD were as follows: Cu kq (Axor = 1.S40S A and,Aroz =1.5443
A,
28 range between 10o and 90o, step sizeof
O.O34o (20), fixed divergence slit = 0.2o, receiving slit = 0.2mm. The crystallite size was calculated using Scherrer's formula [5].RESULT AND DISCUSSION
The Rietveld method of the sample was initiated with the starting model based on the orthorhombic data with space group B2cb. This space group shows an excellent
fit to
ourdiffraction data. The profile refinement was started with scale and background parameters followed by the unit cell parameters. The typical observed and calculated diffraction patterns
for BT and SBT are shown in Figure 1" The refined unit cell pararneters, crystal density and
refinement index are given in Table 1.
ln Fig. 1, it shows that BT and 0.2SBT are an orthorhombic structure and 1.0SBT is a
tetragonal structure, The transition from orthorhombic to tetragonal is significantly influenced by increasing the Sm content" lt is indicated
by'a'and'b'parameters
become closer as seenin
Table 1" Among these parameters,'a'
parameteris
observedto
extremely reduce forabout 1%.
lt
is also found that the crystallite sizefor
respective samples was foundto
bedecreased with increasing the Sm content in bismuth titanate compound as listed in Table 2" Averagely, BT sample has larger crystallite size (69.1nm) as compared with SBT samples. lt reveals that the crystallite size can be tailored by significant amount of Sm content.
ffi,l$*m,
..i..iJ N\
{ I l'l ,.**,
".*^,.".***.*
tfls\i[x$n sqJfi $ &{&.{t$A Page
J
Proceedi4sdSympocium of USM Fellowship Holders 2009 1+I5 taouemher XX}), Universiti Sains Malaysia, penang, Malaysia
t*
of""=-'---'*"-j
n'l
tci iril -li
i,t
1 , ,i
il, , .':l lr
:' i
I lr {
{,
Orihorhonrt,fu i
-. r-'* * i-Ir; ;* :& --&.U.e. .iri " , ..r.t..-...i...-4",,.#.;;.;M#I-".d$d. 4! 'is: *c- ,, #,: t$iisA-r.++-JJ@.rU*m*l$W*diS&i...rd,s:-'eG""""- -&-"-::.- --:-:6'* *
&::
Tctoqg+nd
Fig. 1: The structural refinement patterns of (a) BT, (b) 0.2SBT and (c) 1.0SBT. Experimental
and calculated diffraction pattern is given at the top. The difference profile is shown at the
bottom.
The
Bragg positionsare
indicatedby the
vertical marker belowthe
observed patterns.ln order
to
make a judgment whethera
crystal structural model is adequate or not,the
structural refinement adopts numerical criteria,€.g.
R*p, R"*p, Rpand
R6rrnn. Among several criteria of fit that are commonly used, the most meaningful indices are Rwp because itshows in the numerator for quantity minimized. From numerical and graphical criteria point of
view for the model, considering the final converged R-factors goodness-of-fit indicator for the model obtained from
the
structural refinement using X-ray,it
can be
concluded that the orthorhombic system is more suitable for BT and 0.2SBT and the tetragonal for 1.0SBT.f{ st
{$dJ :1 t:r+:r*4ya*+*s:!$"!danmm*ror*.uo
"
iffil
[image:4.595.66.522.45.401.2]t
,d
Proceedings of Symposium of USM Fellowship Holders 2009
14-15 l{mrember 2(XE}, Universiti Sains Malaysia, penang Malaysia
TaHe 1: Typica! crystallographic and refinement of BT and SBT
Sample BT O.2SBT 1.OSBT
i i E E E r F
i
t F E E E t i t F F iSpace group Crystal system Lattice parameter
a,A
b,A
C,A V. A3
Density, gcm'3
R*%
&
B2cb Orthorhombic 5.4431 5.4074 32.8126 965.79 7.8354 10.65 4.12 B2cb Orthorhombic 5.4327 5.4047 32.8249 963.79 7.8490 11.39 8.13 82cb Orthorhombic 5.3887 5.3886 32.7920 952.21 7.9477 12.40 7.32Table 2: Crystallite size calculated by Scherrer,s formula
Samde BT O.2SBT 1.OSBT
Pedrpocilirr
(ffi)
(08)
(1 r1)
fltn
Aerqe
@ltsrn
74.3 74.2 69.3 58.8 6S.1 72.3 67.4 65.9 54.8 65.1 43.8 51.8 43.1 38.4 44.3 [image:5.595.81.508.142.380.2]!
4
Proceedings of Symposium of USM Fellowship Holders 2009
14-15 November 2009, Universiti Sains Malaysia, penang, Malaysia
CONCLUSION
Through the structural refinement, we found that the crystal structure was greatly influenced
with
significant amountof
Sm
contentin
bismuth titanate compound.lt
was
confirmedthrough the analysis which was discussed in this paper.
ACKNOWLEDGEMENT
The
authors appreciatethe
technical support providedby the
Schoolof
Materials andMineral Resources Engineering, USM. This research was supported by the E-science Fund 305lPbahan/6013357 and the USM Fellowship.
REFERENCE
[1]2.
Lazarevic,B.
D"
stojanovi0,J.
A.
varela, "An
Approachto
Analyzing synthesis, Structure and Properties of Bismuth Titanate Ceramics," Sci. Srnferng, 37 (2005) 1gg-216" [2]S. S. Kim, W.J, Kim, Ferroelectric properties of randomly oriented Bi1-*Pr*Ti3O12 thin films fabricated by a sol-gel method, Thin Solid Films,4A4 (2005) 303-
SO9.[3]Y.c.
chen, c.P"
Hsiung,c.Y" chen, J.y.
Gan,y.M. sun,
c.p.
Lin,
crystallinity andelectrical properties
of
neodymium-substituted bismuth titanate thin films, Thin Sotid Films, 513 (2006) 331-s37.[4]X. Hu, A, Garg,
Z.
H. Barber, Structural and electrical properties of samarium-substituted bismuth titanate ferroelectric thin films on PVT|O*/SiO2/Si substrates, Thin Solid Fitms, 484 (200s) 188-
1e5.[5]A. W. Burton, K. Ong, T. Rea, L Y. Chan, On the estimation of average crystallite size of zeolites from
the
Scherrer equation:A
critical evaluationof
its applicationto
zeolites with one-dimensional pore systems, Microporous and Mesoporous Materials 117 {2OOg) 7S-gO"#;w
flIBmS&ilf;i#$* 'Jt kr
f{''{Jr*"'w***,