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Proceedings of Symposium of USM Fellowship Holders 2009

14-15 November 2009, Universiti Sains Malaysia, penang, Malaysia

STRUCTURAL REFINEMENT OF SAMARIUM BISMUTH TITANATE USING RIETVELD METHOD

Umar Al-Amani Azlan

School of Materials & Mineral Resources Engineering Universiti Sains Malaysia, 14300, penang

ibnu azlan200 5 @ g m a i l. co m

Ahmad Fauzi Mohd Noor

School of Materials & Mineral Resources Engineering Universiti Sains Malaysia, 14300, penang

Srimala Sreekantan

School of Materials & Mineral Resources Engineering Universiti Sains Malaysia, 14300, penang

ABSTRACT

The crystal structure of Bismuth titanate (BT) and Samarium Bismuth titanate (SBT)

was analyzed using Rietveld method. Through the analysis, we found that the orthorhombic structure

of

BT was gradually changed

to

be

a

tetragonal structure which belongs

to

the

SBT'

A

great influence was clearly seen on the crystal structure

as

a

result

of

Samarium content added to the system. Other parameters such as lattice parameter, volume unit and

crystallite size were also changed due to such addition.

Keywords: Bismuth titanate, Samarium, Structural

INTRODUCTION

Bismuth titanate, (Bi4Ti3O12) or generally called BT is

a

ferroelectric material which

has

a

perovskite structure t1l. BT also

is the

promising candidate

for

potential use in the application

of

ferroelectric random access memory (FRAM) owing

to

its

large

remnant

polarization, good fatigue properties on metal electrodes and excellent dielectric properties.

However, BT compound exhibits relatively high leakage current, domain pinning and small remanent polarization, which makes it difficult

to

use BT

for

real device applications tri" ln

previous studies revealed that trivalent cations

of

lanthanide (e.g. La3*, Nd3*, Sm3*" pr3*)

have attracted much attention due

to

their ferroelectric properties were in

the

reasonable

ranges

for

memory applicationt3l" Among

these, sm3.

10.117

nm) ions were used

to

substitute Bi3.(0.108 nm) ions in BT due to larger of their ionic size difference tal. lt is known

that the degree of enhancement of remanent polarization in BT is governed by the difference between ionic sizes of Bi3* and the Sm3* ions. Thus, the larger the ionic size difference, the

lgtrgllE

polarization

will

be.

ln

the

present study,

we

adopted

the

Rietvetd method to

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Proceedings of Symposium of USM Fellowship Holders 2009

14-15 November 2009, Universiti Sains Malaysia, Penang, Malaysia

investigate

the

crystal

structure

of

samarium substituted bismuth

titanate (SBT).

lt

is

necessary to study this method on such parameter of SBT as it has not been performed yet. Due to this reason, therefore we have reported this work throughly in this paper"

EXPERIMENTAL PROCEDURE

The sample was prepared by a modified combustion synthesis using B|(NO3)3.5H2O,

Sm(NO3)3,6HzO

and

Ti[OCH(CHs)z]+

as the

starling materials.

The

powder mixture was calcined at 800oC for

3

h and then, the powder was ground by agate mortar to obtain fine powder.

The

process

was

consistently repeated

for

other samples" These samples were afterward sent

to

X-ray diffraction (XRD) (Bruker DB Advanced)

and

analyzed by Rietveld method. The parameters setting forXRD were as follows: Cu kq (Axor = 1.S40S A and,Aroz =

1.5443

A,

28 range between 10o and 90o, step size

of

O.O34o (20), fixed divergence slit = 0.2o, receiving slit = 0.2mm. The crystallite size was calculated using Scherrer's formula [5].

RESULT AND DISCUSSION

The Rietveld method of the sample was initiated with the starting model based on the orthorhombic data with space group B2cb. This space group shows an excellent

fit to

our

diffraction data. The profile refinement was started with scale and background parameters followed by the unit cell parameters. The typical observed and calculated diffraction patterns

for BT and SBT are shown in Figure 1" The refined unit cell pararneters, crystal density and

refinement index are given in Table 1.

ln Fig. 1, it shows that BT and 0.2SBT are an orthorhombic structure and 1.0SBT is a

tetragonal structure, The transition from orthorhombic to tetragonal is significantly influenced by increasing the Sm content" lt is indicated

by'a'and'b'parameters

become closer as seen

in

Table 1" Among these parameters,

'a'

parameter

is

observed

to

extremely reduce for

about 1%.

lt

is also found that the crystallite size

for

respective samples was found

to

be

decreased with increasing the Sm content in bismuth titanate compound as listed in Table 2" Averagely, BT sample has larger crystallite size (69.1nm) as compared with SBT samples. lt reveals that the crystallite size can be tailored by significant amount of Sm content.

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J

Proceedi4sdSympocium of USM Fellowship Holders 2009 1+I5 taouemher XX}), Universiti Sains Malaysia, penang, Malaysia

t*

of""=-'---'*"-j

n'l

tci iril -l

i

i,t

1 , ,i

i

l, , .':l lr

:' i

I lr {

{,

Orihorhonrt,fu i

-. r-'* * i-Ir; ;* :& --&.U.e. .iri " , ..r.t..-...i...-4",,.#.;;.;M#I-".d$d. 4! 'is: *c- ,, #,: t$iisA-r.++-JJ@.rU*m*l$W*diS&i...rd,s:-'eG""""- -&-"-::.- --:-:6'* *

&::

Tctoqg+nd

Fig. 1: The structural refinement patterns of (a) BT, (b) 0.2SBT and (c) 1.0SBT. Experimental

and calculated diffraction pattern is given at the top. The difference profile is shown at the

bottom.

The

Bragg positions

are

indicated

by the

vertical marker below

the

observed patterns.

ln order

to

make a judgment whether

a

crystal structural model is adequate or not,

the

structural refinement adopts numerical criteria,

€.g.

R*p, R"*p, Rp

and

R6rrnn. Among several criteria of fit that are commonly used, the most meaningful indices are Rwp because it

shows in the numerator for quantity minimized. From numerical and graphical criteria point of

view for the model, considering the final converged R-factors goodness-of-fit indicator for the model obtained from

the

structural refinement using X-ray,

it

can be

concluded that the orthorhombic system is more suitable for BT and 0.2SBT and the tetragonal for 1.0SBT.

f{ st

{$dJ :1 t:r+:r*4ya*+*s:!$"!danmm*ror*.uo

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(5)

t

,d

Proceedings of Symposium of USM Fellowship Holders 2009

14-15 l{mrember 2(XE}, Universiti Sains Malaysia, penang Malaysia

TaHe 1: Typica! crystallographic and refinement of BT and SBT

Sample BT O.2SBT 1.OSBT

i i E E E r F

i

t F E E E t i t F F i

Space group Crystal system Lattice parameter

a,A

b,A

C,A V. A3

Density, gcm'3

R*%

&

B2cb Orthorhombic 5.4431 5.4074 32.8126 965.79 7.8354 10.65 4.12 B2cb Orthorhombic 5.4327 5.4047 32.8249 963.79 7.8490 11.39 8.13 82cb Orthorhombic 5.3887 5.3886 32.7920 952.21 7.9477 12.40 7.32

Table 2: Crystallite size calculated by Scherrer,s formula

Samde BT O.2SBT 1.OSBT

Pedrpocilirr

(ffi)

(08)

(1 r1)

fltn

Aerqe

@ltsrn

74.3 74.2 69.3 58.8 6S.1 72.3 67.4 65.9 54.8 65.1 43.8 51.8 43.1 38.4 44.3 [image:5.595.81.508.142.380.2]
(6)

!

4

Proceedings of Symposium of USM Fellowship Holders 2009

14-15 November 2009, Universiti Sains Malaysia, penang, Malaysia

CONCLUSION

Through the structural refinement, we found that the crystal structure was greatly influenced

with

significant amount

of

Sm

content

in

bismuth titanate compound.

lt

was

confirmed

through the analysis which was discussed in this paper.

ACKNOWLEDGEMENT

The

authors appreciate

the

technical support provided

by the

School

of

Materials and

Mineral Resources Engineering, USM. This research was supported by the E-science Fund 305lPbahan/6013357 and the USM Fellowship.

REFERENCE

[1]2.

Lazarevic,

B.

D"

stojanovi0,

J.

A.

varela, "An

Approach

to

Analyzing synthesis, Structure and Properties of Bismuth Titanate Ceramics," Sci. Srnferng, 37 (2005) 1gg-216" [2]S. S. Kim, W.J, Kim, Ferroelectric properties of randomly oriented Bi1-*Pr*Ti3O12 thin films fabricated by a sol-gel method, Thin Solid Films,4A4 (2005) 303

-

SO9.

[3]Y.c.

chen, c.P"

Hsiung,

c.Y" chen, J.y.

Gan,

y.M. sun,

c.p.

Lin,

crystallinity and

electrical properties

of

neodymium-substituted bismuth titanate thin films, Thin Sotid Films, 513 (2006) 331-s37.

[4]X. Hu, A, Garg,

Z.

H. Barber, Structural and electrical properties of samarium-substituted bismuth titanate ferroelectric thin films on PVT|O*/SiO2/Si substrates, Thin Solid Fitms, 484 (200s) 188

-

1e5.

[5]A. W. Burton, K. Ong, T. Rea, L Y. Chan, On the estimation of average crystallite size of zeolites from

the

Scherrer equation:

A

critical evaluation

of

its application

to

zeolites with one-dimensional pore systems, Microporous and Mesoporous Materials 117 {2OOg) 7S-gO"

#;w

flIBmS&ilf;i#$* 'Jt kr

f{''{Jr*"'w***,

Gambar

Fig. 1: and calculated diffraction pattern bottom. The structural refinement patterns of (a) BT, (b) 0.2SBT and (c) 1.0SBT
Table 2: Crystallite size calculated by Scherrer,s formula

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