Browse Conference Publications > Information Technology and El ...
Evaluation of Edge Orientation
Histograms in smile detection
Sign-In or PurchaseFull Text
2
Smile detection received a enormous attention due to its famous application as a `smile shutter' in digital cameras. Edge Orientation Histograms (EOH) is one of the possible feature descriptors in a smile detector. This paper presents an evaluation of the use of Edge Orientation Histograms in a lip image based smile detector. The system built in this paper aims to discriminate lip images depicting a smile (including thin smile and broad smile) from lip images depicting non-smiling expressions. By dividing the lip images into 2 × 4 cells, and using 5° histogram bin size, we achieved 87.8% arithmetic means of accuracies. The experiments show that it is recommended not to use spatial binning that is too small. However, it is recommended to use fine orientation binning. Finally, it is recommended to use all orientation bins as features.
Published in:
Information Technology and Electrical Engineering (ICITEE), 2014 6th International Conference on
Date of Conference:
7-8 Oct. 2014
Institutional Sign In
Timotius, I.K. ; Dept. of Electron. Eng., Satya Wacana Christian Univ., Salatiga, Indonesia ; Setyawan, I.
Authors References Cited By Keywords Metrics
IEEE.org IEEE | Xplore Digital Library|IEEE Standards|IEEE Spectrum|More Sites Cart (0) Create Account| |Personal Sign In
Abstract
Personal Sign In Create Account|
BROWSE MY SETTINGS GET HELP WHAT CAN I ACCESS? SUBSCRIBE
IEEE Xplore Abstract - Evaluation of Edge Orien...
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?...
IEEE Account
»Change Username/Password
»Update Address
Purchase Details
»Payment Options
»Order History
»Access Purchased Documents
Profile Information
»Communications Preferences
»Profession and Education
»Technical Interests
Need Help?
»US & Canada: +1 800 678 4333
»Worldwide: +1 732 981 0060
»Contact & Support
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology. © Copyright 2015 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions. About IEEE Xplore|Contact Us|Help|Terms of Use|Nondiscrimination Policy|Sitemap|Privacy & Opting Out of Cookies