EE 430.423.001 2016. 2nd Semester
2016. 10. 18.
Changhee Lee
School of Electrical and Computer Engineering Seoul National Univ.
Chapter 5. Diffraction
Part 1
EE 430.423.001 2016. 2nd Semester
• Diffraction is defined as the bending of light around the corners of an obstacle or aperture into the region of geometrical shadow of the obstacle.
• The essential features of diffraction can be explained qualitatively by Huygens’ principle. The Huygens’ principle states that every point on a wavefront actd as the source of a secondary
wave that spreads out in all directions. The envelope of all the secondary waves is the new wave front. Augustin Jean Fresnel (1788-1827) in 1818 explained the diffraction phenomena using the Huygens’ principle and Young’s principle of interference Huygens-Fresnel principle
• We use a more quantitative approach, the Fresnel-Kirchhoff formula to various cases of diffraction of light by obstacles and apertures.
5.1 General description of diffraction
https://en.wikipedia.org/wiki/Huygens%E2%80%93Fresnel_principle Diffraction of a plane wave at a slit whose
width is several times the wavelength.
Diffraction of a plane wave when the slit width equals the wavelength
EE 430.423.001 2016. 2nd Semester
Green’s theorem
) (
) (
) (
, F
, F F
theorem Divergence
) (
) (
2 2 2
V U
V U V
U U
V V U
dV dA
dV U V
U V
dA V U U V
n n
n
∇
⋅
∇ +
∇
=
∇
⋅
∇
∇
−
∇
=
⋅
∇
=
∇
∇
−
∇
=
∇
−
∇
∫∫∫
∫∫
∫∫∫
∫∫
5.2 Fundamental theory
2 2 2 2
2 2 2 2
1 1
t V V u
t U U u
∂
= ∂
∇
∂
= ∂
∇
0 )
( ∇ − ∇ =
∫∫
V nU U nV dAIf both U and V are wave functions and have a harmonic time dependence of the form eiωt.
EE 430.423.001 2016. 2nd Semester
5.2 Fundamental theory
r V e
V
t kr
i( )
0
ω
= +
Suppose that we take V to be the wave function
0 )
( )
( 2 Ω =
∂
− ∂
∂
− ∂
∇
−
∇
∫∫
∫∫
erikr nU U n erikr dA erikr Ur U r erikr r=ρρ dSince V becomes infinite at P, we must exclude that point from the integration.
Subtract an integral over a small sphere of radius r=ρ centered at P and then let ρ shrink to zero.
P
Pd U
U Ω = 4π
∫∫
dA r U
e r
U e
U n
ikr ikr
n
P = − 41π
∫∫
( ∇ − ∇ )Kirchhoff integral theorem
U = optical disturbance
EE 430.423.001 2016. 2nd Semester
Fresnel-Kirchhoff formula
Determine optical disturbance reaching the receiving point P from the source S. V Two basic simplifying assumptions:
(1) The wave function U and its gradient contribute negligible amounts to the integral except at the aperture opening itself.
(2) The values of U and grad U at the aperture are the same as they would be in the absence of the partition.
'
) ' (
0 r
U e U
t kr i −ω
= The wave function U at the aperture
−
∂ =
= ∂
∇
−
∂ =
= ∂
∇
2 ' '
' '
2
' ) '
' , ' cos(
) ' ' , ' cos(
) , cos(
) , cos(
r e r
r ike r n
e r r
r n e
r e r
r ike r n
e r r
r n e
ikr ikr
ikr ikr
n
ikr ikr
ikr ikr
n
r dA e r
e r
e r
e e
U U
ikr n ikr ikr
n ikr t
i
P = 04π−ω
∫∫
( ∇ '' − ' ' ∇ )Smaller than the 1st term if r, r’>> λ.
Smaller than the 1st term if r, r’>> λ.
EE 430.423.001 2016. 2nd Semester
Fresnel-Kirchhoff formula
[
n r n r]
dArr e e
U ikU
r r ik t
i
P = − 40π−ω
∫∫
( +' ') cos(, )−cos(, ')[ ]
'
, 1 ) , 4 cos(
' 0
) (
r e U U
dA r
r n e U U ik
ikr A
t i kr i A P
=
+
−
= π
∫∫
−ω Fresnel-Kirchhoff integral formula
Circular aperture, r'= constant, cos(n,r') = −1
=obliquity factor )]
' , cos(
) ,
[cos(n r n r
−
EE 430.423.001 2016. 2nd Semester
Complementary apertures. Babinet’s principle
If the aperture is divided into two portions A1 and A2 such that A= A1 + A2. The two apertures A1 and A2 are said to be complementary.
From the Fresnel-Kirchhoff integral formula, UP= U1P + U2P (Babinet’s principle)
If UP=0, U1P = - U2P
The complementary apertures yield identical optical disturbances, except that they differ in phase by 180o. The intensity at P is
therefore the same for the two apertures.
EE 430.423.001 2016. 2nd Semester
Babinet’s principle
http://userdisk.webry.biglobe.ne.jp/006/095/15/N000/000/004/136844068624713202721.JPG
EE 430.423.001 2016. 2nd Semester
http://userdisk.webry.biglobe.ne.jp/006/095/15/N000/000/004/136844073251013202889_Corona.JPG
Babinet’s principle
EE 430.423.001 2016. 2nd Semester
5.3 Fraunhofer and Fresnel Diffraction
Fraunhofer diffraction occurs when both the incident and diffracted waves are effectively plane. This will be the case when the distances from the source to the
diffracting aperture and from the aperture to the receiving point are both large enough for the curvatures of the incident and diffracted waves to be neglected.
If either the source or the receiving point is close enough to the diffracting aperture so that the curvature of the wave front is significant, then one has Fresnel Diffraction.
EE 430.423.001 2016. 2nd Semester
5.3 Fraunhofer and Fresnel Diffraction
...
1) ' ( 1 2 ) 1
' ( '
' '
) (
) ' ( '
2
2 2
2 2
2 2
2 2
+ +
+ +
=
+
− +
− +
+ +
+ +
=
∆
δ δ
δ δ
d d
d h d
h
h d
h d
h d
h d
The quadratic term is a measure of the curvature of the wave front. The wave is effectively plane over the aperture if
λ δ <<
+ 1) 2 '
( 1 2 1
d d
Criterion for Fraunhofer diffraction
The variation of the quantity r+r’ from one edge of the aperture to the other is given by
EE 430.423.001 2016. 2nd Semester
5.4 Fraunhofer Diffraction Patterns
[
n r n r]
dArr e e
U ikU
r r ik t
i
P = − 40π−ω
∫∫
( +' ') cos(, )−cos(, ')Simplifying assumptions:
(1) The angular spread of the diffracted light is small enough for the obliquity factor not to vary appreciably over the aperture and to be taken outside the integral.
(2) eikr’/r’ is nearly constant and can be taken outside the integral.
(3) The variation of eikr/r over the aperture comes principally from the exponential part, so that the factor 1/r can be replaced by its mean value and taken outside the integral.
dA e
C
UP =
∫∫
ikrEE 430.423.001 2016. 2nd Semester
5.4 Fraunhofer diffraction patterns for the single slit
F. A. Jenkins and H. E. White, Fundamentals of Optics, 3rd ed. (McGraw-Hill, 1957)
EE 430.423.001 2016. 2nd Semester
5.4 Fraunhofer diffraction patterns for the single slit
0 for
of value the
sin
0
0
=
=
+
=
y r
r
y r
r θ
For a single slit of length L and width b, dA=Ldy.
CbL e
C kb
C
k kb L
Ce
Ldy e
Ce U
ikr ikr
b b ikr iky
0 0
0
' , 2 sin
1 sin ) ( '
sin
) 2 sin
sin(1 2
2 2
sin
=
=
=
=
=
∫
−+θ β
β
β θ
θ
θ
EE 430.423.001 2016. 2nd Semester
5.4 Fraunhofer diffraction patterns for the single slit
The irradiance distribution in the focal plane is
The maximum value occurs at θ=0, and minimum values occur for β=mπ=±π, ±2π, ±3π, …
The 1st minimum, β=π, sinθ=2π/kb=λ/b.
slit the
of area 0,
for irradiance
sin ) (
2 0
2 0
2
∝
=
=
=
=
CbL I
I U
I
θ β
β
EE 430.423.001 2016. 2nd Semester
5.4 Fraunhofer diffraction patterns for the single slit
(Prob. 5.5)
The secondary maxima occur at θ for which β=tanβ. β=1.43π, 2.46π,
3.47π, ...
F. A. Jenkins and H. E. White, Fundamentals of Optics, 3rd ed. (McGraw-Hill, 1957)
EE 430.423.001 2016. 2nd Semester
5.4 Fraunhofer diffraction for the rectangular aperture
For a rectangular aperture of width a and height b, dA=dxdy.
2 2
0 sin )
( sin )
( β
β α
I α I =
, 2 sin
1 , 2 sin
1 φ β θ
α = ka = kb
The minimum values occur for α=±π, ±2π, … and β=±π, ±2π, …
EE 430.423.001 2016. 2nd Semester
5.4 Fraunhofer diffraction for the circular aperture
For a circular aperture of radius R, dA = 2 R2 − y2dy
2 2 0
2 1
0 2 ( ) , where ( )
R C J I
I
I π
ρ
ρ =
=
0 as
, 2 / 1 /
) (
kind 1st
the of function Bessel
) (
/ ) ( 1
sin
,
2
1 1
1 1 2
1
2 2
0 sin
→
→
=
=
−
=
=
−
=
∫
∫
+
−
+
−
ρ ρ
ρ ρ
ρ ρ π
θ ρ
ρ
θ
J J
J du
u e
R kR u y
dy y R
e Ce
U
u i
R R
iky ikr
EE 430.423.001 2016. 2nd Semester
5.4 Fraunhofer diffraction for the circular aperture
aperture the
of diameter 2
22 . 1 832 . sin 3
=
=
≈
=
= R D
D
kR λ θ
θ
The bright central area is known as the Airy disk.
1st zero of the Bessel function ρ=3.832.
The angular radius of the 1st dark ring is
EE 430.423.001 2016. 2nd Semester
Optical Resolution
The image of a distant point source formed at the focal plane of a camera lens is a Fraunfoffer diffraction pattern for which the aperture is the lens opening D.
Thus the image of a composite source is a superposition of many Airy disks.
The resolution in the image depends on the size of the individual Airy disks.
Rayleigh criterion: minimum angular separation between two equal point sources such that they can be just barely resolved. At this angular separation the central maximum of the image of one source falls on the 1st minimum of the other.
22 . 1
D θ ≈ λ
Rayleigh criterion for the resolution
EE 430.423.001 2016. 2nd Semester
5.4 Fraunhofer diffraction for the double slit
For a circular aperture of radius R, dA = 2 R2 − y2dy
( )
( )
β γ β
θ γ
θ β
β γ β θ
θ
γ β
θ θ
θ θ
θ
θ θ
θ
2 2
0
sin sin
sin sin
) ( sin
sin 0
sin sin
sin cos
2 sin 1
, 2 sin
1
sin cos 2
sin 1 1 sin 1
1
=
=
=
=
+
−
=
− +
−
=
+
=
+
∫
+∫
∫
I I
kh kb
e be
ik e e
e e
ik e
dy e
dy e
dy e
i i
ikh ikb
ikb b
h ik ikb
b h h b iky
iky Aperture
iky
EE 430.423.001 2016. 2nd Semester
5.4 Fraunhofer diffraction for the double slit
The single-slit factor (sinβ/β)2 appears as the envelope for the interference firnges given by the term cos2γ. Bright fringes occur for γ=0, ±π, ±2π, …
The angular separation between fringes is given by ∆γ=π.
2
h kh
λ θ ≈ π = π ∆
θ θ
γ = ∆ =
∆ cos
2 1 kh
EE 430.423.001 2016. 2nd Semester
5.4 Fraunhofer diffraction for the double slit
F. A. Jenkins and H. E. White, Fundamentals of Optics, 3rd ed. (McGraw-Hill, 1957)
EE 430.423.001 2016. 2nd Semester
5.4 Fraunhofer diffraction for the double slit
F. A. Jenkins and H. E. White, Fundamentals of Optics, 3rd ed. (McGraw-Hill, 1957)
EE 430.423.001 2016. 2nd Semester
Multiple slits, Diffraction gratings
[ ]
θ γ
θ β
γ γ β
β θ
θ
γ β
θ θ θ
θ θ θ
θ θ
2 sin 1
, 2 sin
1
sin sin sin
1 1 sin
1
....
sin 1 1
....
) 1 (
sin sin sin
sin ) 1 ( sin
sin
) 1 (
) 1 ( 2 sin
2 0
sin
kh kb
e N be
e e ik
e
e ik e
e
dy e
dy e
N i i
ikh ikNh ikb
h N ik ikh
ikb
b h N
h N hb iky
h b
h h b
Aperture iky
=
=
=
−
⋅ −
= −
+ +
− +
=
+ +
+ +
=
−
−
+
−
−
+
∫ ∫
∫
∫
∫
2 2
0 sin
sin
sin
=
γ γ β
β
N I N
I
A diffraction pattern of a 633 nm laser through a grid of 150 slits https://en.wikipedia.org/wiki/Diffraction
The factor N has been inserted in order to
normalize the expression, so that I=I0 when θ=0.
EE 430.423.001 2016. 2nd Semester
Multiple slits, Diffraction gratings
The single-slit factor (sinβ/β)2 appears as the envelope of the diffraction pattern.
Principal maxima occur within the envelope for γ=nπ , n=0, π, 2π, …
θ λ hsin n =
Secondary maxima occur for γ=3π/2Ν, 5π/2Ν, …
Zeros occur for γ=π/Ν, 2π/Ν, …
n=order of diffraction
2 2
0 sin
sin
sin
=
γ γ β
β
N I N
I
EE 430.423.001 2016. 2nd Semester
Multiple slits, Diffraction gratings
cos
, 2 cos
1
θ θ γλ
θ π θ
γ kh Nh
N = ∆ ∴∆ =
=
∆
Resolving power of a grating spectroscope according to the Rayleigh criterion
Nn
RP =
= ∆ λ λ
The angular width of a principal fringe is found by setting the change of Nγ equal to π.
θ λ hsin n =
If N is made very large, then ∆θ is very small, and the diffraction pattern consists of a series of sharp fringes corresponding to the different orders n=0, ±π, ±2π, …
For a given order the dependence of θ on the wavelength gives by differentiation θ
θ λ
cos h
= n∆
∆
For a typical grating with 600 lines/mm ruled over a total width of 10 cm, N=60,000 and the theoretical resolving power can be 60,000n.